About Contact Probes

Contact Probes

Contact probes are specialized electrical test probes that are placed against the component surface and measure electrical characteristics such as voltage and current. They are usually attached to the tip of a handheld testing device known as a probe station. They are used to check electrical connections and perform voltage, current, and power measurements. They can also be used to detect short circuits, open circuits, and other electronics faults.Contact probes are especially useful in engineering and design, as they allow engineers to obtain quick readings of voltage, current, and other electrical parameters without having to open components or expose them to the risk of extremely high voltages. Additionally, they can now be used to read digital data stored on modern chips, allowing for more efficient testing of integrated circuits.
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Image  Information Image Stock Code(▲▼)Description
Manufacturer
Global Stock ⓘ (▲▼)Price(USD

(Ex. GST)(▲▼)
Enter Qty TypeTip StyleLengthCurrent RatingSpring ForceTravelSeries
  
           
TK 32N 08 2,00 S 170 R


Test probe; Operational spring compression:4.2mm; 3A
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This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges.

TEKON Availability : 0
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USD 2.7582

Multiples of: 1

   3 A   
TK36L.11.1,80.S.170.A


Test probe; Operational spring compression:5mm; Min.pitch:4mm
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TEKON Availability : 0
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USD 2.8184

Multiples of: 1

   3 A   
101582-000


Contact Probes CONTACT - 70MIL
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Smiths Interconnect Availability : 0
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USD 2.8249

Multiples of: 100

Probes 2.57 mm20 A1.7 Oz0.76 Mm101582
ICT-100-UR-6.7-G-S


SPRING CONTACT PROBE
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This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges.

Interconnect Devices Availability : 0
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USD 2.8316

Multiples of: 1

   3 A   
CT10046-YEU-L


Yamaichi Electronics Contact Probes 1MM P CROWN 4.58MM L .61MM TRVL 27G FORCE
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This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges.

Yamaichi Availability : 0
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USD 2.8435

Multiples of: 1

       
100737-01


Contact Probes Batt Contact Probe 100 mil 2.2 oz.
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Smiths Interconnect Availability : 0
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USD 2.8744

Multiples of: 1

Probes  3 A  100737
S-075-C-3-G


Contact Probes HEADLESS FLAT
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Smiths Interconnect Availability : 0
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USD 2.9125

Multiples of: 1

ProbesFlat33.27 mm3 A3 Oz4.32 MmS - 075
ICT-50C-V8-5.6-DG


Contact Probes 8-POINT CROWN HIGH PERFORMANCE
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1

ProbesCrown34.59 mm3 A5.6 Oz4.32 MmIct - 50C
ICT-50C-V8-4.3-DG


Contact Probes HEADED 8 PT CRWN
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1

ProbesCrown34.59 mm3 A4.3 Oz4.32 MmIct - 50C
ICT-50C-SW-4.3-DG-S


Contact Probes HEADLESS 74 DEG SHARP ARRWHEAD STEEL
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1

ProbesArrowhead34.59 mm3 A4.3 Oz4.32 MmIct - 50C
S-50C-M-5.6-DG-S


Contact Probes HEADLESS BLADE 101385-010-927
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1000

ProbesBlade34.59 mm3 A5.6 Oz4.32 MmS - 50C
S-50C-T-5.6-DG-S


Contact Probes HEADED 2 SIDED CHISEL PROBE
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1000

ProbesChisel34.59 mm3 A5.6 Oz4.32 MmS - 50C
S-50C-A-5.6-DG


Contact Probes HEADED 90 DEG CONVEX 101385-000-927
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Smiths Interconnect Availability : 0
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USD 2.9662

Multiples of: 1000

ProbesConcave34.59 mm3 A5.6 Oz4.32 MmS - 50C
S-100-S-8-RT


Contact Probes HEADLESS 60 DEG CHSL ROTATOR OPTION
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Smiths Interconnect Availability : 0
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USD 3.0068

Multiples of: 1

ProbesChisel33.27 mm3 A8 Oz4.32 MmS - 100
S-100-LM-10-RT


Contact Probes HEADED 90 DEG STAR ROTATOR OPTION
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Smiths Interconnect Availability : 0
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USD 3.0068

Multiples of: 1

ProbesStar33.27 mm3 A10 Oz4.32 MmS - 100
100891-003-922


Contact Probes BATTERY CONTACT 3.5OZ
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Smiths Interconnect Availability : 0
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USD 3.0129

Multiples of: 1000

ProbesSpherical Radius9.02 mm15 A3.5 Oz1.7 Mm100891
R-100-S-DE


Contact Probes 60 DEG CHISELED POINT BECU PLUNGER
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Smiths Interconnect Availability : 0
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USD 3.0188

Multiples of: 1000

ReceptaclesSpear39.5 mm 2.7 Oz R
XP3B-3029-5050-1-R/S


Contact Probes Contact Probe B 0.4mm pitch
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This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges.

Omron Availability : 0
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USD 3.0429

Multiples of: 50

      X3pb
XP3B-3029-5050-1-S/R


Contact Probes Contact Probe B 0.4mm pitch
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Omron Availability : 0
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USD 3.0429

Multiples of: 50

      X3pb
ICT-50C-TL-5.6-DG-S


Contact Probes HEADED 60 DEG .035 CHISEL STEEL
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Smiths Interconnect Availability : 0
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USD 3.0575

Multiples of: 1

ProbesCrown34.59 mm3 A5.6 Oz4.32 MmIct - 50C
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