X-On Electronics has gained recognition as a prominent supplier of ADL5513-EVALZ RF Development Tools across the USA, India, Europe, Australia, and various other global locations. ADL5513-EVALZ RF Development Tools are a product manufactured by Analog Devices. We provide cost-effective solutions for RF Development Tools, ensuring timely deliveries around the world.

ADL5513-EVALZ Analog Devices

ADL5513-EVALZ electronic component of Analog Devices
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Part No.ADL5513-EVALZ
Manufacturer: Analog Devices
Category: RF Development Tools
Description: RF Development Tools Evaluation board for ADL5513
Datasheet: ADL5513-EVALZ Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 188.3498 ea
Line Total: USD 188.35 
Availability - 0
MOQ: 1  Multiples: 1
Pack Size: 1
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Ship by Wed. 04 Dec to Tue. 10 Dec
MOQ : 1
Multiples : 1
1 : USD 490.8607

0
Ship by Wed. 04 Dec to Tue. 10 Dec
MOQ : 1
Multiples : 1
1 : USD 188.3498

0
Ship by Mon. 02 Dec to Wed. 04 Dec
MOQ : 1
Multiples : 1
1 : USD 305.2426

   
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We are delighted to provide the ADL5513-EVALZ from our RF Development Tools category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the ADL5513-EVALZ and other electronic components in the RF Development Tools category and beyond.

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1 MHz to 4 GHz, 80 dB Logarithmic Detector/Controller Data Sheet ADL5513 FEATURES FUNCTIONAL BLOCK DIAGRAM NC NC CLPF NC Wide bandwidth: 1 MHz to 4 GHz 16 15 14 13 80 dB dynamic range (3 dB) Constant dynamic range over frequency 12 DET DET DET DET DET I V VOUT o o 1 VPOS Stability over 40 C to +85 C temperature range: 0.5 dB o o Operating temperature range: 40 C to +125 C INHI 2 I V 11 VSET Sensitivity: 70 dBm INLO 3 Low noise measurement/controller output (VOUT) ADL5513 10 COMM Pulse response time: 21 ns/20 ns (fall/rise) VPOS 4 SLOPE BAND GAP GAIN Single-supply operation: 2.7 V to 5.5 V at 31 mA 9 TADJ CONTROL REFERENCE BIAS Power-down feature: 1 mW at 5 V 5 6 7 8 Small footprint LFCSP NC NC NC NC Fabricated using high speed SiGe process Figure 1. APPLICATIONS RF transmitter power amplifier linearization and gain/power control Power monitoring in radio link transmitters RSSI measurement in base stations, WLAN, WiMAX, RADAR GENERAL DESCRIPTION The ADL5513 is a demodulating logarithmic amplifier, capable The feedback loop through an RF amplifier is closed via VOUT, of accurately converting an RF input signal to a corresponding the output of which regulates the amplifier output to a magni- decibel-scaled output. It employs the progressive compression tude corresponding to VSET. The ADL5513 provides 0 V to technique over a cascaded amplifier chain, each stage of which (V 0.1 V) output capability at the VOUT pin, suitable POS is equipped with a detector cell. The device can be used in either for controller applications. As a measurement device, VOUT measurement or controller modes. The ADL5513 maintains is externally connected to VSET to produce an output voltage, accurate log conformance for signals up to 4 GHz. The input V , that increases linear-in-dB with RF input signal amplitude. OUT dynamic range is typically 80 dB (referred to 50 ) with error less The logarithmic slope is 21 mV/dB, determined by the VSET than 3 dB and 74 dB with error less than 1 dB. The ADL5513 interface. The intercept is 88 dBm (referred to 50 , conti- has 20 ns response time that enables RF burst detection to a nuous wave input, 900 MHz) using the INHI input. These pulse rate of beyond 50 MHz. The device provides unprecedented parameters are very stable against supply and temperature logarithmic intercept stability vs. ambient temperature conditions. variations. A supply of 2.7 V to 5.5 V is required to power the device. Current The ADL5513 is fabricated on a SiGe bipolar IC process and consumption is 31 mA, and it decreases to 200 A when the is available in a 3 mm 3 mm, 16-lead LFCSP package for the device is disabled. 40C to +125C operating temperature range. A fully populated The ADL5513 can be configured to provide a control voltage to evaluation board is available. a power amplifier or a measurement output from the VOUT pin. Because the output can be used for controller applications, special attention has been paid to minimize wideband noise. In this mode, the setpoint control voltage is applied to the VSET pin. Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. rights of third parties that may result from its use. Specifications subject to change without notice. No Tel: 781.329.4700 20082017 Analog Devices, Inc. All rights reserved. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com 07514-001ADL5513 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Setpoint Interface ....................................................................... 15 Applications ....................................................................................... 1 Description of Characterization ............................................... 15 Functional Block Diagram .............................................................. 1 Error Calculations ...................................................................... 16 General Description ......................................................................... 1 Adjusting Accuracy Through Choice of Calibration Points 16 Revision History ............................................................................... 2 Temperature Compensation of Output Voltage ..................... 17 Specif icat ions ..................................................................................... 3 Device Calibration ..................................................................... 18 Absolute Maximum Ratings ............................................................ 7 Power-Down Functionality ....................................................... 18 ESD Caution .................................................................................. 7 Measurement Mode ................................................................... 19 Pin Configuration and Function Descriptions ............................. 8 Setting the Output Slope in Measurement Mode .................. 19 Typical Performance Characteristics ............................................. 9 Controller Mode ......................................................................... 20 Theory of Operation ...................................................................... 13 Constant Power Operation ....................................................... 20 Applications Information .............................................................. 14 Increasing the Dynamic Range of the ADL5513 ................... 22 Basic Connections ...................................................................... 14 Evaluation Board ............................................................................ 23 Input Signal Coupling ................................................................ 14 Outline Dimensions ....................................................................... 25 Output Filtering .......................................................................... 14 Ordering Guide .......................................................................... 25 Output Interface ......................................................................... 15 REVISION HISTORY 8/2017Rev. 0 to Rev. A Change to Figure 2 ........................................................................... 8 Updated Outline Dimensions ...................................................... 25 Changes to Ordering Guide .......................................................... 25 10/2008Revision 0: Initial Version Rev. A Page 2 of 25

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8543.70.00 Other machines and apparatus Free
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9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

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8538.10.10 22 For programmable controllers Free
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