X-On Electronics has gained recognition as a prominent supplier of EV-ADE9153ASHIELDZ Power Management IC Development Tools across the USA, India, Europe, Australia, and various other global locations. EV-ADE9153ASHIELDZ Power Management IC Development Tools are a product manufactured by Analog Devices. We provide cost-effective solutions for Power Management IC Development Tools, ensuring timely deliveries around the world.

EV-ADE9153ASHIELDZ Analog Devices

EV-ADE9153ASHIELDZ electronic component of Analog Devices
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Part No.EV-ADE9153ASHIELDZ
Manufacturer: Analog Devices
Category: Power Management IC Development Tools
Description: Power Management IC Development Tools ADE9153A Arduino Shield Eval Board
Datasheet: EV-ADE9153ASHIELDZ Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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1: USD 244.4782 ea
Line Total: USD 244.48 
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Energy Metering IC with Autocalibration Data Sheet ADE9153A FEATURES GENERAL DESCRIPTION 1 mSure autocalibration The ADE9153A is a highly accurate, single-phase, energy metering Automatic calibration based on a direct measurement of IC with autocalibration. The mSure autocalibration feature allows the full signal path a meter to automatically calibrate the current and voltage channels Calibration procedure not requiring a reference meter without using an accurate source or an accurate reference meter mSure autocalibration Class 1 meter guaranteed when a shunt resistor is used as a current sensor. Class 1 and 3 high performance ADCs Class 2 meters are supported by mSure autocalibration. 88 dB SNR The ADE9153A incorporates three high performance analog- High gain current channel: 26.04 mV peak, 18.4 mV rms to-digital converters (ADCs), providing an 88 dB signal-to-noise input at highest gain setting ratio (SNR). The ADE9153A offers an advanced metrology feature Advanced metrology feature set set of measurements like line voltage and current, active energy, WATT, VAR, VA, Wh, VARh, and VAh fundamental reactive energy, and apparent energy calculations, Supports active energy standards: IEC 62053-21 and current and voltage rms calculations. ADE9153A includes IEC 62053-22 EN50470-3 OIML R46 and ANSI C12.20 power quality measurements such as zero crossing detection, line Supports reactive energy standards: IEC 62053-23 and period calculation, angle measurement, dip and swell, peak and IEC 62053-24 overcurrent detection, and power factor measurements. Each input Current and voltage rms measurement channel supports independent and flexible gain stages. Current Power quality measurements Channel A is ideal for shunts, having a flexible gain stage and Operating temperature, industrial range: 40C to +85C providing full-scale input ranges from 62.5 mV peak down to APPLICATIONS 26.04 mV peak. Current Channel B has gain stages of 1, 2, and 4 for use with current transformers (CTs). A high speed, Single-phase energy meters 10 MHz, serial peripheral interface (SPI) port allows access to Energy and power measurement the ADE9153A registers. Street lighting Smart power distribution system Note that throughout this data sheet, multifunction pins, such Machine health as ZX/DREADY/CF2, are referred to either by the entire pin name or by a single function of the pin, for example, CF2, when only that function is relevant. The ADE9153A operates from a 3.3 V supply and is available in a 32-lead LFCSP package. TYPICAL APPLICATIONS CIRCUIT NEUTRAL PHASE AGND/DGND ADE9153A VAMS mSure VOLTAGE DRIVER DIGITAL SIGNAL PROCESSING VAN CLKIN CLOCK GENERATION R SINC AND CLKOUT R SMALL ADC BIG VAP DECIMATION AGND/DGND CF CF1 GENERATION IAN METROLOGY ENGINE R SHUNT ADC PGA WATT, VA, VAR, IAP ZERO ZX/DREADY/CF2 WATT-HR, VA-HR, CROSSING IAMS VAR-HR, IRMS, VRMS mSure IBMS CURRENT DRIVER IRQ IBP mSure DETECTOR PGA ADC B SS IBN SCLK SPI AGND/DGND TEMPERATURE INTERFACE MISO/TX SAR SENSOR LOAD MOSI/RX Figure 1. 1 Protected by U.S. Patents 8,350,558 8,010,304 WO2013038176 A3 0113507 A1 0253102 A1 0354266 A1 and 0154029 A1. Rev. 0 Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. rights of third parties that may result from its use. Specifications subject to change without notice. No Tel: 781.329.4700 2018 Analog Devices, Inc. All rights reserved. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com 16519-001ADE9153A Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 mSure Autocalibration Feature ................................................. 21 Applications ....................................................................................... 1 Measurements ............................................................................. 22 General Description ......................................................................... 1 Power Quality Measurements ................................................... 26 Typical Applications Circuit ............................................................ 1 Applications Information .............................................................. 29 Revision History ............................................................................... 2 Interrupts/Events ........................................................................ 29 Specif icat ions ..................................................................................... 3 IRQ Pin Interrupts ...................................................................... 29 Autocalibration ............................................................................. 6 Servicing Interrupts ................................................................... 29 SPI Timing Characteristics ......................................................... 7 CF2/ZX/DREADY Event Pin ................................................... 29 Absolute Maximum Ratings ............................................................ 8 Accessing On-Chip Data ............................................................... 30 Thermal Resistance ...................................................................... 8 SPI Protocol Overview .............................................................. 30 ESD Caution .................................................................................. 8 UART Interface ........................................................................... 30 Pin Configuration and Function Descriptions ............................. 9 Communication VerifIcation Registers ................................... 31 Typical Performance Characteristics ........................................... 11 CRC of Configuration Registers............................................... 31 Energy Linearity Over Supply and Temperature ................... 11 Configuration Lock .................................................................... 31 Energy Error Over Frequency and Power Factor................... 13 Register Information ...................................................................... 32 RMS Linearity Over Temperature and RMS Error Over Register Summary ...................................................................... 32 Frequency .................................................................................... 14 Register Details ........................................................................... 36 Signal-To-Noise Ratio (SNR) Performance Over Dynamic Outline Dimensions ....................................................................... 50 Range ............................................................................................ 17 Ordering Guide .......................................................................... 50 Test Circuit ...................................................................................... 18 Terminology .................................................................................... 19 Theory of Operation ...................................................................... 21 REVISION HISTORY 2/2018Revision 0: Initial Version Rev. 0 Page 2 of 50

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