X-On Electronics has gained recognition as a prominent supplier of EVAL-ADE9000EBZ Power Management IC Development Tools across the USA, India, Europe, Australia, and various other global locations. EVAL-ADE9000EBZ Power Management IC Development Tools are a product manufactured by Analog Devices. We provide cost-effective solutions for Power Management IC Development Tools, ensuring timely deliveries around the world.

EVAL-ADE9000EBZ Analog Devices

EVAL-ADE9000EBZ electronic component of Analog Devices
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Part No.EVAL-ADE9000EBZ
Manufacturer: Analog Devices
Category: Power Management IC Development Tools
Description: Power Management IC Development Tools ADE9000 eval board
Datasheet: EVAL-ADE9000EBZ Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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High Performance, Multiphase Energy, and Power Quality Monitoring IC Data Sheet ADE9000 FEATURES Events, such as dip and swell, can trigger waveform storage Simplifies data collection for IEC 61000-4-7 harmonic analysis 7 high performance ADCs Advanced metrology feature set 101 dB SNR Total and fundamental active power, volt amperes reactive Wide input voltage range: 1 V, 707 mV rms FS at gain = 1 (VAR), volt amperes (VA), watthour, VAR hour, and VA hour Differential inputs Total and fundamental IRMS, VRMS 25 ppm/C maximum channel drift (including ADC, internal Total harmonic distortion VREF, PGA drift) enabling 10000:1 dynamic input range Power factor Class 0.2 metrology with standard external components Supports active energy standards: IEC 62053-21 and Power quality measurements IEC 62053-22 EN50470-3 OIML R46 and ANSI C12.20 Enables implementation of IEC 61000-4-30 Class S Supports reactive energy standards: IEC 62053-23, IEC 62053-24 VRMS , IRMS rms voltage refreshed each half cycle High speed communication port: 20 MHz serial port 10 cycle rms/12 cycle rms interface (SPI) Dip and swell monitors Integrated temperature sensor with 12-bit successive Line frequencyone per phase approximation register (SAR) ADC Zero crossing, zero-crossing timeout 3C accuracy from 40C to +85C Phase angle measurements APPLICATIONS Supports CTs and Rogowski coil (di/dt) sensors Multiple range phase/gain compensation for CTs Energy and power monitoring Digital integrator for Rogowski coils Power quality monitoring Flexible waveform buffer Protective devices Able to resample waveform to ensure 128 points per line Machine health cycle for ease of external harmonic analysis Smart power distribution units Polyphase energy meters GENERAL DESCRIPTION sampling rate that varies based on line frequency to ensure 1 128 points per line cycle. Resampling simplifies fast Fourier The ADE9000 is a highly accurate, fully integrated, multiphase energy and power quality monitoring device. Superior analog transform (FFT) calculation of at least 50 harmonics in an performance and a digital signal processing (DSP) core enable external processor. accurate energy monitoring over a wide dynamic range. An The ADE9000 simplifies the implementation of energy and integrated high end reference ensures low drift over temperature power quality monitoring systems by providing tight integration of with a combined drift of less than 25 ppm/C maximum for acquisition and calculation engines. The integrated ADCs and the entire channel including a programmable gain amplifier DSP engine calculate various parameters and provide data (PGA) and an analog-to-digital converter (ADC). through user accessible registers or indicate events through The ADE9000 offers complete power monitoring capability by interrupt pins. With seven dedicated ADC channels, the providing total as well as fundamental measurements on rms, ADE9000 can be used on a 3-phase system or up to three active, reactive, and apparent powers and energies. Advanced single-phase systems. It supports current transformers (CTs) or features such as dip and swell monitoring, frequency, phase Rogowski coils for current measurements. A digital integrator eliminates a discrete integrator required for Rogowski coils. angle, voltage total harmonic distortion (VTHD), current total harmonic distortion (ITHD), and power factor measurements The ADE9000 absorbs most complexity in calculations for a enable implementation of power quality measurements. The power monitoring system. With a simple host microcontroller, cycle rms and 10 cycle rms/12 cycle rms, calculated according to the ADE9000 enables the design of standalone monitoring or IEC 61000-4-30 Class S, provide instantaneous rms measurements protection systems, or low cost nodes uploading data into the cloud. for real-time monitoring. Note that throughout this data sheet, multifunction pins, such The ADE9000 offers an integrated flexible waveform buffer that as CF4/EVENT/DREADY, are referred to either by the entire stores samples at a fixed data rate of 32 kSPS or 8 kSPS, or a EVENT pin name or by a single function of the pin, for example, , when only that function is relevant. 1 Protected by U.S. Patents 8,350,558 8,010,304. Other patents are pending. Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. rights of third parties that may result from its use. Specifications subject to change without notice. No Tel: 781.329.4700 2017 Analog Devices, Inc. All rights reserved. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com ADE9000 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Signal-to-Noise Ratio Performance ......................................... 23 Applications ....................................................................................... 1 Test Circuit ...................................................................................... 24 General Description ......................................................................... 1 Terminology .................................................................................... 25 Revision History ............................................................................... 2 Theory of Operation ...................................................................... 26 Typical Applications Circuit ............................................................ 3 Measurements ............................................................................. 26 Specifications ..................................................................................... 4 Power Quality Measurements ................................................... 31 Timing Characteristics ................................................................ 8 Waveform Buffer ............................................................................ 35 Absolute Maximum Ratings ............................................................ 9 Interrupts/Events ............................................................................ 36 Thermal Resistance ...................................................................... 9 Accessing On-Chip Data ............................................................... 37 ESD Caution .................................................................................. 9 SPI Protocol Overview .............................................................. 37 Pin Configuration and Function Descriptions ........................... 10 Additional Communication Verification Registers ............... 37 Typical Performance Characteristics ........................................... 12 CRC of Configuration Registers............................................... 37 Energy Linearity over Supply and Temperature ..................... 12 Configuration Lock .................................................................... 37 Energy Error over Frequency and Power Factor .................... 15 Register Map ................................................................................... 38 Energy Linearity Repeatability ................................................. 16 Register Details ............................................................................... 51 RMS Linearity over Temperature and RMS Error over Outline Dimensions ....................................................................... 72 Frequency .................................................................................... 17 Ordering Guide .......................................................................... 72 Energy and RMS Linearity with Integrator On ...................... 19 Energy and RMS Error over Frequency with Integrator On ..... 21 REVISION HISTORY 6/2017Rev. 0 to Rev. A Changes to General Description .................................................... 1 Change to Operating Temperature Parameter, Table 3 ............... 9 Change to Temperature Section ................................................... 34 Change to Waveform Buffer Section ............................................ 35 Change to Address 0x4FE, Table 6 ............................................... 47 1/2017Revision 0: Initial Version Rev. A Page 2 of 72

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