MIL-M-38510/4D 14 December 2004 SUPERSEDING MIL-M-38510/4C 25 February 1977 MIL-M-0038510/4B(USAF) 15 October 1973 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, TTL, MULTIPLE NOR GATES, MONOLITHIC SILICON Inactive for new desi gn after 7 September 1995. This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic, silicon, TTL, positive NOR logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type Circuit 01 Quadruple 2-input positive NOR gate 02 Dual 4-input positive NOR gate with strobe and expandable input 03 Dual 4-input positive NOR gate with strobe 04 Triple 3-input positive NOR gate 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style A GDFP5-F14 or CDFP6-F14 14 Flat pack B GDFP4-14 14 Flat pack C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat-pack Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at MIL-M-38510/4D 1.2.4 Absolute maximum ratings. Supply voltage range ...................................................... -0.5 V dc to +7.0 V dc Input voltage range ......................................................... -1.5 V dc at -12 mA to +5.5 V dc Storage temperature range ............................................ -65C to +150C Maximum power dissipation per gate, P ...................... 60 mW dc 1/ D Lead temperature (soldering 10 seconds) ...................... 300C Thermal resistance, junction-to-case ( )...................... (See MIL-STD-1835) JC Junction temperature (T ) 2/.......................................... 175C J 1.2 Recommended operating conditions. Supply voltage................................................................. 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage ................................... 2.0 V dc Maximum low level input voltage .................................... 0.8 V dc Normalized fanout (each output) .................................... 10 maximum Case operating temperature range (T ) ......................... -55C to 125C C 2.0 APPLICABLE DOCUMENT 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard for Microelectronics. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at