BIF Document
Semiconductor Fuse
35785307
1-50A, 700 Volts
Size 1451
4
10
6
4
2
3
10
6
4
2
FWP-25A14F
2
10
FWP-30A14F
FWP-32A14F
6
FWP-40A14F
4
FWP-50A14F
2
1
10
6
4
2
0
10
6
FWP-5A14F
4
FWP-10A14F
FWP-15A14F
2
FWP-20A14F
1
10
6
4
2
2
10
6
4
2
3
10
6
4
2
4
10
24 68 1 242 68 2 22468 3
10 10 10
Prospective Current In Amperes RMS
Approved: NN Page 1 of 2
Pre-Arcing Time-Current Characteristic Curves
FWP 1A14F-50A14F
Rev. Date: SEPT-97 Pub. Date: JAN-98
BUSSMANN BUSSMANN U.K. BUSSMANN DENMARK
P.O. Box 14460 Burton-on-the-Wolds 5 Literbuen
St. Louis, MO 63178-4460 Leicestershire LE12 5TH DK-2740 Skovlunde
U.S.A. England Copenhagen, Denmark
Phone: 636-394-2877 Phone: 44-1509-882737 Phone: 45-4485-0900
Fax: 800-544-2570 Fax: 44-1509-882786 Fax: 45-4485-0901
1-17-01 SB00233 Intl Fax: 636-527-1413
Bussmann reserves the right without notice to change design and/or discontinue distribution of this product.
Virtual Pre-Arcing Time In SecondsBIF Document
Semiconductor Fuse
357815307
1-50A, 700 Volts
Size 1451
4
10
FWP-50A14F
6
FWP-40A14F
FWP-32A14F
4
FWP-30A14F
FWP-25A14F
2
3
10
6
4
2
FWP-20A14F
FWP-15A14F
2
10
FWP-10A14F
FWP-5A14F
6
4
2
1
10
246 2 46 246 2 46 2
1 2 3 4 5
10 10 10 10 10
Prospective Short-Circuit Current Symmetrical RMS
Approved: NN Page 2 of 2
Peak Let-Through Cut-Off Current Characteristic Curves
FWP 1A14F-50A14F
Rev. Date: SEPT-97 Pub. Date: JAN-98
The only controlled copy of this BIF document is the electronic read-only version located on the Bussmann Network Drive. All other copies of this BIF document are by definition
uncontrolled. This bulletin is intended to clearly present comprehensive product data and provide technical information that will help the end user with design applications. Bussmann
reserves the right, without notice, to change design or construction of any products and to discontinue or limit distribution of any products. Bussmann also reserves the right to
1-17-01 SB00233 change or update, without notice, any technical information contained in this bulletin. Once a product has been selected, it should be tested by the user in all possible applications.
Peak Let-Through Current