FWP-80A Eaton

Semiconductor Fuse BIF Document 35785308 35-100A 700 Volts Size 700-1200A 4 10 6 4 2 3 10 6 4 2 FWP-700A 2 10 FWP-800A FWP-900A 6 FWP-1000A 4 FWP-1200A 2 1 10 6 FWP-35B 4 FWP-40B FWP-50B 2 FWP-60B 0 FWP-70B 10 FWP-80B 6 FWP-90B 4 FWP-100B 2 1 10 6 4 2 2 10 6 4 2 3 10 6 4 2 4 10 24 68 22468 242 68 2 3 4 10 10 10 Prospective Current In Amperes RMS Approved: NN Page 1 of 2 Minimum Melting Time-Current Characteristic Curves FWP 35B-100B & 700A-1200A Rev. Date: SEPT-97 Pub. Date: JAN-98 BUSSMANN BUSSMANN U.K. BUSSMANN DENMARK P.O. Box 14460 Burton-on-the-Wolds 5 Literbuen St. Louis, MO 63178-4460 Leicestershire LE12 5TH DK-2740 Skovlunde U.S.A. England Copenhagen, Denmark Phone: 314-394-2877 Phone: 44-1509-882737 Phone: 45-4485-0900 Fax: 800-544-2570 Fax: 44-1509-882786 Fax: 45-4485-0901 Intl Fax: 314-527-1413 7-11-01 SB01191 Bussmann reserves the right without notice to change design and/or discontinue distribution of this product. Virtual Pre-Arcing Time In SecondsSemiconductor Fuse BIF Document 35785308 35-100A 700 Volts Size 700-1200A 6 10 FWP-1200A FWP-1000A 6 FWP-800A 4 FWP-700A 2 4 10 6 4 2 3 10 6 FWP-100B 4 FWP-70B FWP-60B FWP-50B 2 FWP-40B FWP-35B 2 10 24 6 2 4 6 24 6 2 2 3 4 5 10 10 10 10 Prospective Short-Circuit Current Approved: NN Page 2 of 2 Peak Let-Through Cut-Off Current Characteristic Curves FWP 35B-100B & 700A-1200A Rev. Date: SEPT-97 Pub. Date: JAN-98 The only controlled copy of this BIF document is the electronic read-only version located on the Bussmann Network Drive. All other copies of this BIF document are by definition uncontrolled. This bulletin is intended to clearly present comprehensive product data and provide technical information that will help the end user with design applications. Bussmann reserves the right, without notice, to change design or construction of any products and to discontinue or limit distribution of any products. Bussmann also reserves the right to change or update, without notice, any technical information contained in this bulletin. Once a product has been selected, it should be tested by the user in all possible applications. 7-11-01 SB01191 Peak Let-Through Current