In-circuit debugging probes I-jet I-jet is a slim in-circuit debugging probe, which connects to the target board via a JTAG or SWD connection, and to the host PC via the USB port. It is fully plug-and-play compatible, seamlessly integrated into the IAR Embedded Workbench IDE, and enables high-speed debugging and full power profiling. Key features Support for ARM7/ARM9/ARM11 and Cortex-M/R/A cores Embedded Trace Buffer (ETB) support Seamless integration into the IAR Embedded Workbench Download speed of up to 1MByte/sec IDE (IAR Embedded Workbench for ARM, version 6.30.8 or Automatic core recognition later) Support for multiple JTAG devices with automatic chain Plug-and-play compatibility detection and graphical display High-speed USB 2.0 interface (480Mbps) Direct download into flash memory of most popular Powered entirely through USB microcontrollers Target power of up to 400mA can be supplied from I-jet Support for JTAG adaptive clocking (RTCK) with overload protection Automatic JTAG/SWD detection Target power consumption can be measured with ~200A JTAG voltage measurement and monitoring resolution at 200kHz Supports target voltage range from 1.65V to 5V JTAG and Serial Wire Debug (SWD) clocks up to 32MHz Standard MIPI-20 and MIPI-10 JTAG cables are included (no limit on the MCU clock speed) ARM-20 (0.1in x 0.1in) JTAG adapter is included Serial Wire Viewer (SWV) with UART and Manchester encoding For more product information, visit www.iar.com/ijet Support for SWO speeds of up to 60MHz Power Debugging I-jet enables refined power measurements in IAR Embedded Workbench and lets you monitor the power consumption during program execution. Combining I-jet with I-scope adds current and voltage measurements. Thanks to the correlation with the source code, you can find out how the power consumption is affected by the code, and test and tune for power optimization. IAR Embedded Workbench integrates Power Debugging in your code writing process, allowing you to develop low-power software from the very beginning. www.iar.comI-scope I-scope is a small probe that adds current and voltage measurement capabilities to I-jet. The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench for ARM. Key features - Reduce RF emissions by identifying and eliminating I-scope measures current and voltages and sends it to unwanted current spikes I-jet, which synchronizes the data with the program coun- - Measure and compare battery consumption in various ter of the running application. MCU sleep modes The data can be graphed and profiled in real time and analyzed using the C-SPY Debugger in IAR Embedded Workbench for ARM. Specifications The current sensing is done by connecting two differential I+ and I- differential voltage, 110mV full scale across current measurement leads across a shunt resistor on the shunt resistor target board. One differential current channel, 0-6V common mode The power analysis can for example be used to: Three voltage channels, 0-6V - Reveal the power consumption of individual functions Sampling rate up to 200 kHz with 12 bit resolution and peripherals Includes a MIPI-20 flat cable for attaching to the I-jet - Identify I/O activities that cause current spikes Includes 6 flying test leads and 6 grabbers - Diagnose low power mode Supports all ARM cores - Investigate MCU frequency and core voltage power I-scope is used in combination with I-jet savings - Find conflicting hardware setup For more product information, visit www.iar.com/iscope IAR Systems, IAR Embedded Workbench, C-SPY, visualSTATE, The Code to Success, IAR KickStart Kit, I-jet, IAR, and the logotype of IAR Systems are trademarks or registered trademarks owned by IAR Systems AB. 2013 IAR Systems AB www.iar.com ds-ijet-5