MULTILAYER CERAMIC CAPACITORS/AXIAL & RADIAL LEADED Multilayer ceramic capacitors are available in a edges of the laminated structure. The entire structure is variety of physical sizes and configurations, including fired at high temperature to produce a monolithic leaded devices and surface mounted chips. Leaded block which provides high capacitance values in a styles include molded and conformally coated parts small physical volume. After firing, conductive with axial and radial leads. However, the basic terminations are applied to opposite ends of the chip to capacitor element is similar for all styles. It is called a make contact with the exposed electrodes. chip and consists of formulated dielectric materials Termination materials and methods vary depending on which have been cast into thin layers, interspersed the intended use. with metal electrodes alternately exposed on opposite TEMPERATURE CHARACTERISTICS Ceramic dielectric materials can be formulated with Class III: General purpose capacitors, suitable a wide range of characteristics. The EIA standard for for by-pass coupling or other applications in which ceramic dielectric capacitors (RS-198) divides ceramic dielectric losses, high insulation resistance and dielectrics into the following classes: stability of capacitance characteristics are of little or no importance. Class III capacitors are similar to Class II capacitors except for temperature characteristics, Class I: Temperature compensating capacitors, which are greater than 15%. Class III capacitors suitable for resonant circuit application or other appli- have the highest volumetric efficiency and poorest cations where high Q and stability of capacitance char- stability of any type. acteristics are required. Class I capacitors have predictable temperature coefficients and are not effected by voltage, frequency or time. They are made KEMET leaded ceramic capacitors are offered in from materials which are not ferro-electric, yielding the three most popular temperature characteristics: superior stability but low volumetric efficiency. Class I C0G: Class I, with a temperature coefficient of 0 capacitors are the most stable type available, but have 30 ppm per degree C over an operating the lowest volumetric efficiency. temperature range of - 55C to + 125C (Also known as NP0). X7R: Class II, with a maximum capacitance Class II: Stable capacitors, suitable for bypass change of 15% over an operating temperature or coupling applications or frequency discriminating range of - 55C to + 125C. circuits where Q and stability of capacitance char- Z5U: Class III, with a maximum capacitance acteristics are not of major importance. Class II change of + 22% - 56% over an operating tem- capacitors have temperature characteristics of 15% perature range of + 10C to + 85C. or less. They are made from materials which are ferro-electric, yielding higher volumetric efficiency but less stability. Class II capacitors are affected by Specified electrical limits for these three temperature temperature, voltage, frequency and time. characteristics are shown in Table 1. SPECIFIED ELECTRICAL LIMITS TEMPERATURE CHARACTERISTICS PARAMETER C0G X7R Z5U Dissipation Factor: Measured at following conditions: C0G 1 kHz and 1 vrms if capacitance > 1000 pF 1 MHz and 1 vrms if capacitance 1000 pF 0.15% 2.5% 4.0% X7R 1 kHz and 1 vrms* or if extended cap range 0.5 vrms Z5U 1 kHz and 0.5 vrms Dielectric Strength: 2.5 times rated DC voltage. Pass Subsequent IR Test Insulation Resistance (IR): At rated DC voltage, 1,000 M -F 1,000 M -F 1,000 M -F whichever of the two is smaller or 100 G or 100 G or 10 G Temperature Characteristics: Range, C -55 to +125 -55 to +125 +10 to +85 Capacitance Change without 0 30 ppm/C 15% +22%, -56% DC voltage * 1 MHz and 1 vrms if capacitance 100 pF on military product. Table I KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300 3 Multlayer Ceramic CapacitorsCERAMIC CONFORMALLY COATED/AXIAL & RADIAL PERFORMANCE CHARACTERISTICS FOR STANDARD AND HIGH VOLTAGE GENERAL SPECIFICATIONS ENVIRONMENTAL Working Voltage: Vibration: Axial (WVDC) Radial (WVDC) EIA RS-198, Method 304, Condition D (10-2000Hz 20g) C0G 50 & 100 50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k Shock: X7R 50 & 100 50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k EIA RS-198, Method 305, Condition I (100g) Z5U 50 & 100 50 & 100 Life Test: Temperature Characteristics: EIA RS-198, Method 201, Condition D. C0G 0 30 PPM / C from - 55C to + 125C (1) 200V X7R 15% from - 55C to + 125C C0G 200% of rated voltage +125C Z5U + 22% / -56% from + 10C to + 85C X7R 200% of rated voltage +125C Z5U 200% of rated voltage +85C Capacitance Tolerance: 500V C0G 0.5pF, 1%, 2%, 5%, 10% C0G rated voltage +125C X7R 10%, 20%, +80% / -20%, +100% / -0% X7R rated voltage +125C Z5U 20%, +80% / -20% Post Test Limits 25C are: Construction: Capacitance Change: Epoxy encapsulated - meets flame test requirements of UL C0G ( 200V) +3% or 0.25pF, whichever is greater. Standard 94V-0. C0G ( 500V) +3% or 0.50pF, whichever is greater. High-temperature solder - meets EIA RS-198, Method 302, X7R + 20% of initial value (2) Condition B (260C for 10 seconds) Z5U + 30% of initial value (2) Dissipation Factor: Lead Material: C0G 0.15% maximum 100% matte tin (Sn) with nickel (Ni) underplate and steel core. X7R 2.5% maximum Z5U 4.0% maximum Solderability: Insulation Resistance: EIA RS-198, Method 301, Solder Temperature: 230C 5C. C0G 10k Megohm or 100 Megohm x F, whichever is less. Dwell time in solder = 7 seconds. 1kV tested 500V. X7R 10k Megohm or 100 Megohm x F, whichever is less. Terminal Strength: 1kV tested 500V. EIA RS-198, Method 303, Condition A (2.2kg) Z5U 1k Megohm or 100 Megohm x F , whichever is less. Moisture Resistance: ELECTRICAL EIA RS-198, Method 204, Condition A (10 cycles without Capacitance 25C: applied voltage.) Within specified tolerance and following test conditions. Post Test Limits 25C are: C0G > 1000pF with 1.0 vrms 1 kHz Capacitance Change: 1000pF with 1.0 vrms 1 MHz C0G ( 200V) +3% or 0.25pF, whichever is greater. X7R with 1.0 vrms 1 kHz C0G ( 500V) +3% or 0.50pF, whichever is greater. Z5U with 1.0 vrms 1 kHz X7R + 20% of initial value (2) Z5U + 30% of initial value (2) Dissipation Factor 25C: Dissipation Factor: Same test conditions as capacitance. C0G 0.25% maximum C0G 0.15% maximum X7R 3.0% maximum X7R 2.5% maximum Z5U 4.0% maximum Z5U 4.0% maximum Insulation Resistance: C0G 10k Megohm or 100 Megohm x F, whichever is less. Insulation Resistance 25C: 500V test rated voltage, 1kV test 500V. EIA RS-198, Method 104, Condition A <1kV X7R 10k Megohm or 100 Megohm x F , whichever is less. C0G 100k Megohm or 1000 Megohm x F , whichever is less. 500V test rated voltage, >1kV test 500V. 500V test rated voltage, 1kV test 500V Z5U 1k Megohm or 100 Megohm x F, whichever is less. X7R 100k Megohm or 1000 Megohm x F, whichever is less. 500V test rated voltage, 1kV test 500V Thermal Shock: Z5U 10k Megohm or 1000 Megohm x F, whichever is less. EIA RS-198, Method 202, Condition B (C0G & X7R: -55C to +125C) Condition A (Z5U: -55C to 85C) Dielectric Withstanding Voltage: EIA RS-198, Method 103 200V test 250% of rated voltage for 5 seconds with current (1)+53 PPM -30 PPM/ C from +25C to -55C, + 60 PPM below limited to 50mA. 10pF. 500V test 150% of rated voltage for 5 seconds with current (2)X7R and Z5U dielectrics exhibit aging characteristics there- limited to 50mA. fore, it is highly recommended that capacitors be deaged for 2 1000V test 120% of rated voltage for 5 seconds with current hours at 150C and stabilized at room temperature for 48 limited to 50mA. hours before capacitance measurements are made. 4 KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300