Tantalum Surface Mount Capacitors High Reliability T493 High Reliability Alternative MnO (CWR11 Style) 2 Overview The KEMET T493 Series is designed for the Commercial KEMETs patented Simulated Breakdown Screening (SBDS) Off-The-Shelf (COTS) requirements of military and is a nondestructive testing technique that simulates the aerospace applications. This series is a surface mount breakdown voltage (BDV) of a capacitor without damage to product offering various lead-frame plating options, its dielectric or to the general population of capacitors. This Weibull grading options, surge current testing, F-Tech (an screening identifies hidden defects in the dielectric, providing improved anode manufacturing process) and Simulated the highest level of dielectric testing. SBDS is based on the Breakdown Voltage (SBDV) screening options to improve simulation of breakdown voltage (BDV), the ultimate test of long term reliability. Standard, low, and ultra-low ESR the dielectric in a capacitor. options are available. All lots of this series are conditioned with MILPRF55365 Group A testing. This series is also Low BDV indicates defects in the dielectric, and therefore, a approved for DLA Drawing 07016 (please see part number higher probability of failure in the field. High BDV indicates list specific to this drawing). a stronger dielectric and high-reliability performance in the field. This new screening method allows KEMET to identify KEMETs F-Tech eliminates hidden defects in the dielectric the breakdown voltage of each individual capacitor and which continue to grow in the field, causing capacitor provide only the strongest capacitors from each lot. failures. Based on the fundamental understanding of degradation mechanisms in tantalum and niobium SBDS is currently available on select part types in the T493 capacitors, F-Tech incorporates multiple process and T497 Series. Please contact KEMET for details on methodologies. Some minimize the oxygen and carbon ordering other part types with these capabilities. content in the anodes which become contaminants and can lead to the crystallization of the anodic oxide KEMET offers these technologies per the following options: dielectric. This process methodology reduces the F-Tech only contaminants, improving quality of the dielectric. An SBDS only additional technology provides a stronger mechanical Combination of both F-Tech and SBDS for the ultimate connection point between the tantalum lead wire and protection tantalum anode, enhancing robustness and product reliability. The benefit of F-Tech is illustrated by a 2,000 hour, 85C, 1.32 X rated voltage accelerated life test. F-Tech parts see no degradation while standard tantalum s have 1.5 orders of magnitude degradation in leakage current. F-Tech is currently available for the T493 Series (select D and X case capacitance values in 25 V and higher rated voltage). Please contact KEMET for details on ordering other part types with these capabilities. Built Into Tomorrow KEMET Electronics Corporation P.O. Box 5928 Greenville, SC 29606 864-963-6300 www.kemet.com T2007 T493 10/14/2021 1Tantalum Surface Mount Capacitors High Reliability T493 High Reliability Alternative MnO (CWR11 Style) 2 Benefits F-Tech and Simulated Breakdown Voltage (SBDS) Termination options B, C, H, K, T, N, and M screening options available Weibull failure options B and C Tape & Reel standard packaging per EIA 481 All parts tested per Group A of MILPRF55365 Symmetrical, compliant terminations Approved for DLA Drawing 07016 applications* * Defense Logistics Agency (DLA), previously identified as DSCC Laser-marked case 100% surge current test available on all case sizes Applications Typical applications include decoupling and filtering in military and aerospace applications. Environmental Compliance RoHS compliant when ordered with 100% Sn solder. Halogen-free Epoxy compliant with UL94 V-0 Molded Epoxy complies for outgassing testing under ASTM E 595. K-SIM For a detailed analysis of specific part numbers, please visit ksim.kemet.com to access KEMETs K-SIM software. KEMET K-SIM is designed to simulate behavior of components with respect to frequency, ambient temperature, and DC bias levels. Ordering Information T 493 D 227 K 006 C H 61 20 Rated Capacitor Case Capacitance Capacitance Failure Rate/ Packaging Series Voltage Termination Finish Surge ESR Class Size Code (pF) Tolerance Design (C-Spec) (VDC) T = Military A, First two J = 5% 004 = 4 A = N/A C = Hot solder dipped 61 = None 10 = ESR Blank = 7 Tantalum COTS B, digits K = 10% 006 = 6.3 B = 0.1% H = Standard solder 62 = 10 Cycles after Standard Reel C, represent M = 20% 010 = 10 /1,000 hours coated (SnPb 5% Pb Weibull, 25C 20 = ESR 7280 = 13 D, significant 016 = 16 C = 0.01% minimum) 63 = 10 cycles after Low Reel E, figures. 020 = 20 /1,000 hours B = Gold plated Weibull, 55C and 30 = ESR 7610 = Bulk X Third digit 025 = 25 K = Solder fused 85C after Weibull Ultra low Bag specifies 035 = 35 T = 100% Tin 64 = 10 cycles 7640 = Bluk number of 050 = 50 N = Non-magnetic before Weibull,55 plastic box zeros. 063 = 63 100% Tin (Sn) and +85C WAFL = M = Non-magnetic Waffle Pack (SnPb) For detailed part number offerings, please refer to: Table 1A COTS, Table 1B DLA Drawing 07016 KEMET Electronics Corporation P.O. Box 5928 Greenville, SC 29606 864-963-6300 www.kemet.com T2007 T493 10/14/2021 22