Tantalum Surface Mount Capacitors High Reliability T497 High Reliability Series (HRA) MnO (CWR09/19/29 Style) 2 Overview The KEMET T497 is designed for the High Reliability KEMETs patented Simulated Breakdown Screening (SBDS) Series (HRA) requirements of military, medical, and is a nondestructive testing technique that simulates the aerospace applications. This product is a HRA version breakdown voltage (BDV) of a capacitor without damage to of CWR09,19, and 29 products. The T497 Series is a its dielectric or to the general population of capacitors. This surface mount product offering various lead-frame plating screening identifies hidden defects in the dielectric, providing options, Weibull grading options, X-ray inspection, surge the highest level of dielectric testing. SBDS is based on the current testing, F-Tech (an improved anode manufacturing simulation of breakdown voltage (BDV), the ultimate test of process) and Simulated Breakdown Voltage (SBDV) the dielectric in a capacitor. screening options to improve long term reliability. Low BDV indicates defects in the dielectric, and therefore, a KEMETs F-Tech eliminates hidden defects in the dielectric, higher probability of failure in the field. High BDV indicates which continue to grow in the field, causing capacitor a stronger dielectric and high-reliability performance in the failures. Based on the fundamental understanding of field. This new screening method allows KEMET to identify degradation mechanisms in tantalum and niobium the breakdown voltage of each individual capacitor and capacitors, F-Tech incorporates multiple process provides only the strongest capacitors from each lot. methodologies. Some minimize the oxygen and carbon content in the anodes, which become contaminants SBDS is currently available on select part types in the T493 and can lead to the crystallization of the anodic oxide and T497 series. Please contact KEMET for details on dielectric. This process methodology reduces the ordering other part types with these capabilities. contaminants, improving quality of the dielectric. An additional technology provides a stronger mechanical KEMET offers these technologies per the following options: connection point between the tantalum lead wire and F-Tech only tantalum anode, enhancing robustness and product SBDS only reliability. The benefit of F-Tech is illustrated by a 2,000 Combination of both F-Tech and SBDS for the ultimate hour, 85C, 1.32 X rated voltage accelerated life test. The protection F-Tech parts see no degradation while standard tantalums have 1.5 orders of magnitude degradation in leakage current. F-Tech is currently available for T493 (select D and X case capacitance values in 25 V and higher rated voltage), and T497 (select H case capacitance values in 25 V and higher rated voltage). Please contact KEMET for details on ordering other part types with these capabilities. Built Into Tomorrow KEMET Electronics Corporation KEMET Tower One East Broward Boulevard T2011 T497 10/12/2021 1 Fort Lauderdale, FL 33301 USA 954-766-2800 www.kemet.comTantalum Surface Mount Capacitors High Reliability T497 High Reliability Series (HRA) MnO (CWR09/19/29 Style) 2 Benefits F-Tech and Simulated Breakdown Voltage (SBDS) 100% surge current test available on all case sizes screening options available Termination options B, H, and T Tape & Reel standard packaging per EIA 481 Weibull failure options B and C Symmetrical, compliant terminations 100% thermal shock Laser-marked case Applications Typical applications include decoupling and filtering in military, medical, and aerospace applications. Environmental Compliance RoHS compliant when ordered with 100% Sn solder. Halogen-free Epoxy compliant with UL94 V-0 Molded Epoxy complies for outgassing testing under ASTM E 595. K-SIM For a detailed analysis of specific part numbers, please visit ksim.kemet.com to access KEMETs K-SIM software. KEMET K-SIM is designed to simulate behavior of components with respect to frequency, ambient temperature, and DC bias levels. Ordering Information T 497 G 226 K 020 A H 61 10 Rated Capacitor Case Capacitance Capacitance Failure Rate/ Packaging Series Voltage Termination Finish Surge X-ray Class Size Code (pF) Tolerance Design (C-Spec) (VDC) T = High A First two K = 10% 004 = 4 A = N/A T = 100% Matte Tin 61 = Standard 10 = None Blank = 7 Tantalum grade B digits M = 20% 006 = 6.3 B = 0.1%/ (Sn)-plated (in-process) 15 = 100% Reel COTS C represent 010 = 10 1,000 hours H = Standard 62 = 10 Cycles after 7280 = 13 D significant 016 = 16 C = 0.01%/ solder-coated Weibull, 25C Reel E figures. Third 020 = 20 1,000 hours (SnPb 5% Pb 63 = 10 Cycles after 7610 = Bulk F digit specifies 025 = 25 minimum) Weibull, 55 and 85C bag G number of 035 = 35 B = Gold-plated 64 = 10 Cycles before 7640 = Bulk H zeros. 050 = 50 C = Hot solder Weibull, 55 and 85C plastic box X dipped WAFL = K = Solder fused Waffle pack KEMET Electronics Corporation KEMET Tower One East Broward Boulevard T2011 T497 10/12/2021 22 Fort Lauderdale, FL 33301 USA 954-766-2800 www.kemet.com