X5R Dielectric General Specifications GENERAL DESCRIPTION General Purpose Dielectric for Ceramic Capacitors EIA Class II Dielectric Temperature variation of capacitance is within 15% from -55C to +85C Well suited for decoupling and filtering applications Available in High Capacitance values (up to 100F) PART NUMBER (see page 2 for complete part number explanation) 1210 4 D 107 M A T 2 A Size Voltage Dielectric Capacitance Capacitance Failure Special Terminations Packaging Code (In pF) Tolerance Rate Code ( x ) 4 = 4V D = X5R 2 = 7 Reel T = Plated Ni 2 Sig. Digits + K = 10% A = N/A A = Std. 0101** 6 = 6.3V 4 = 13 Reel and Sn Number of M = 20% 0201 Z = 10V 7 = Bulk Cass. Zeros 9 = Bulk 0402 Y = 16V U = 4mm TR 0603 3 = 25V (01005) 0805 D = 35V 1206 5 = 50V 1210 1 = 100V 1812 **EIA 01005 NOTE: Contact factory for availability of Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. TYPICAL ELECTRICAL CHARACTERISTICS Temperature Coefficient Insulation Resistance vs Temperature 10,000 20 15 10 1,000 5 0 -5 100 -10 -15 -20 0 -60 -40 -20 0 +20 +40 +60 +80 0 20 40 60 80 100 120 Temperature C Temperature C 24 % Capacitance Insulation Resistance (Ohm-Farads)X5R Dielectric Specifications and Test Methods Parameter/Test X5R Specification Limits Measuring Conditions Operating Temperature Range -55C to +85C Temperature Cycle Chamber Capacitance Within specified tolerance 2.5% for 50V DC rating Freq.: 1.0 kHz 10% 3.0% for 25V DC rating Voltage: 1.0Vrms .2V Dissipation Factor 12.5% Max. for 16V DC rating and lower For Cap > 10 F, 0.5Vrms 120Hz Contact Factory for DF by PN 10,000M or 500M - F, Charge device with rated voltage for Insulation Resistance whichever is less 120 5 secs room temp/humidity Charge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds 12% Resistance to Variation 1mm/sec Flexure Dissipation Meets Initial Values (As Above) Stresses Factor Insulation Initial Value x 0.3 90 mm Resistance 95% of each terminal should be covered Dip device in eutectic solder at 230 5C Solderability with fresh solder for 5.0 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance 7.5% Variation Dip device in eutectic solder at 260C for 60 Dissipation Resistance to seconds. Store at room temperature for 24 2 Meets Initial Values (As Above) Factor Solder Heat hours before measuring electrical properties. Insulation Meets Initial Values (As Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Step 1: -55C 2 30 3 minutes Capacitance 7.5% Step 2: Room Temp 3 minutes Variation Dissipation Thermal Meets Initial Values (As Above) Step 3: +85C 2 30 3 minutes Factor Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Resistance Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Strength 24 2 hours at room temperature Appearance No visual defects Charge device with 1.5X rated voltage in Capacitance test chamber set at 85C 2C for 1000 hours 12.5% Variation (+48, -0). Note: Contact factory for *optional Dissipation specification part numbers that are tested at Initial Value x 2.0 (See Above) Load Life Factor < 1.5X rated voltage. Insulation Initial Value x 0.3 (See Above) Resistance Remove from test chamber and stabilize Dielectric at room temperature for 24 2 hours Meets Initial Values (As Above) Strength before measuring. Appearance No visual defects Store in a test chamber set at 85C 2C/ Capacitance 12.5% 85% 5% relative humidity for 1000 hours Variation (+48, -0) with rated voltage applied. Load Dissipation Initial Value x 2.0 (See Above) Humidity Factor Remove from chamber and stabilize at Insulation Initial Value x 0.3 (See Above) room temperature and humidity for Resistance 24 2 hours before measuring. Dielectric Meets Initial Values (As Above) Strength 25