Reference Only Spec.No.JENF243A-9134C-01 P.1/9 Chip Ferrite Bead BLM03HSH1D Murata Standard Reference Specification AEC-Q200 1.Scope This reference specification applies to Chip Ferrite Bead for Automotive Electronics BLM03H SH series based on AEC-Q200. 2.Part Numbering (ex.) BL M 03 HG 601 S H 1 D (1) (2) (3) (4) (5) (6) (7) (8) (9) (1)Product ID (4)Characteristics (7)Category(for Automotive Electronics) (2)Type (5)Typical Impedance at 100MHz (8)Numbers of Circuit (3)Dimension (LW) (6)Performance(S:general/F:Low Rdc) (9)Packaging (D:Taping) 3.Rating DC Resistance ( max.) Impedance () (refer to below Rated ESD Rank (Under Standard Customer MURATA comment) Current 2 :2kV Testing Condition) Part Number Part Number (mA) Initial Values Values After at100MHz at1GHz Testing 60025 100040% BLM03HG601SH1D 150 1.6 1.7 100025 180040% 2 BLM03HG102SH1D 125 2.6 2.7 BLM03HG122SH1D 120025 200040% 100 3.5 3.6 Operating Temperature : -55C to +125C Storage Temperature : -55C to +125C Standard Testing Conditions < Unless otherwise specified > < In case of doubt > Temperature : Ordinary Temp. (15 C to 35 C ) Temperature : 20C2 C Humidity : Ordinary Humidity (25%(RH) to 85%(RH)) Humidity : 60%(RH) to 70%(RH) Atmospheric pressure : 86kPa to 106kPa 4.Style and Dimensions 0.60.03 0.30.03 Equivalent Circuit Resistance element becomes 0.150.05 () dominant at high frequencies. :Electrode Unit Weight (Typical value) (in mm) 0.3mg 5.Marking No marking. MURATA MFG.CO.,LTD. 0.30.03Reference Only Spec.No.JENF243A-9134C-01 P.2/9 6.Specifications 6-1.Electrical Performance No. Item Specification Test Method 6-1-1 Impedance Meet item 3. Measuring Frequency : 100MHz1MHz,1GHz1MHz Measuring Equipment : KEYSIGHT4291A or the equivalent Test Fixture : KEYSIGHT16192A or the equivalent 6-1-2 DC Resistance Meet item 3. Measuring Equipment : Digital multi meter *Except resistance of the Substrate and Wire 6-2.Mechanical Performance (based on Table 13 for FILTER EMI SUPPRESSORS/FILTERS) AEC-Q200 Rev.D issued June. 1 2010 AEC-Q200 Murata Specification / Deviation No. Stress Test Method 3 High 1000hours at 125 deg C Meet Table A after testing. Temperature Set for 24hours Table A Exposure at room temperature, Appearance No damage then measured. Impedance Change Within 50% (at 100MHz) DC Meet item 3. Resistance 4 Temperature Cycling 1000cycles Meet Table A after testing. -55 deg C to +125 deg C Set for 24hours at room temperature, then measured. 5 Destructive Per EIA469 No defects Physical Analysis No electrical tests 7 Biased Humidity 1000hours at 85 deg C, 85%RH Meet Table A after testing. Apply max rated current. 8 Operational Life Apply 125 deg C 1000hours Meet Table A after testing. Set for 24hours at room temperature, then measured 9 External Visual Visual inspection No abnormalities 10 Physical Dimension Meet ITEM 4 No defects Style and Dimensions 12 Resistance Per MIL-STD-202 Method 215 Not Applicable to Solvents 13 Mechanical Shock Per MIL-STD-202 Method 213 Meet Table B after testing. Condition F: Table B 1500g s(14.7N)/0.5ms/Half sine Appearance No damage Impedance Change Within 30% (at 100MHz) DC Meet item 3. Resistance 14 Vibration 5g s(0.049N) for 20 minutes Meet Table B after testing. 12cycles each of 3 oritentations Test from 10-2000Hz. 15 Resistance Solder temperature Pre-heating: 150C +/-10 deg C, 60s to 90s to Soldering Heat 260C+/-5 deg C Immersion time 10s Meet Table B after testing. MURATA MFG.CO.,LTD.