DLW32SH510XK2L Murata

Reference Only Spec. No. JEFL243C-9119A-01 P1/9 Wire Wound Chip Common Mode Choke Coil DLW32SHXK2 Murata Standard Reference Specification AEC-Q200 1.Scope This reference specification applies to Wire Wound Chip Common Mode Choke Coil DLW32SH XK Series for Automotive Electronics based on AEC-Q200. 2.Part Numbering (ex) DL W 32 S H 101 X K 2 L (1) (2) (3) (4) (5) (6) (7) (8) (9) (10) (1) Product ID (6) Inductance(Typ. at 0.1MHz) (2) Structure (7) Circuit (3) Dimension Type(LxW) (8) Features (4) Type (9) Number of line (5) Category (10) Packing code L : Taping( 180mm), *B:Bulk *Bulk packing also available. (A product is put in the plastic bag under the taping conditions.) 3.Rating Common Mode Rated Withstanding Rated DC Insulation ESD Inductance Customer Murata Rank Voltage Voltage Current Resistance Resistance (at 0.1MHz Part Number Part Number Under Standard 5B:15kV V(DC) V(DC) (mA) ( max.) (M min.) Testing Condition) 11uH (-30%/+50%) DLW32SH110XK2L 80 200 300 0.4 10 5B 11uH (-30%/+50%) DLW32SH110XK2B 80 200 300 0.4 10 5B 22uH (-30%/+50%) DLW32SH220XK2L 80 200 250 0.5 10 5B 22uH (-30%/+50%) DLW32SH220XK2B 80 200 250 0.5 10 5B 51uH (-30%/+50%) DLW32SH510XK2L 80 200 200 0.7 10 5B 51uH (-30%/+50%) DLW32SH510XK2B 80 200 200 0.7 10 5B 100uH (-30%/+50%) DLW32SH101XK2L 80 200 150 1.5 10 5B 100uH (-30%/+50%) DLW32SH101XK2B 80 200 150 1.5 10 5B Operating Temperature Range. 40C to +125C Storage Temperature Range. 40C to +125C 4. Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temperature / 15C to 35C Temperature : 20C 2C Humidity : Ordinary Humidity / 25%(RH) to 85 %(RH) Humidity : 60%(RH) to 70 %(RH) Atmospheric Pressure : 86kPa to 106 kPa 5. Appearance and Dimensions Equivalent Circuits (1) (2) (4) (3) No polarity Unit Mass (Typical value) 0.072g 6. Marking No Marking. Reference Only Spec. No. JEFL243C-9119A-01 P2/9 7. Electrical Performance No. Item Specification Test Method 7.1 Common Mode Meet item 3. Measuring Equipment : KEYSIGHT 4294A or the equivalent Inductance (Lc) Measuring Frequency:0.1MHz (ref.item 9.1) 7.2 Insulation Measuring voltage : Rated Voltage Resistance (I.R.) Measuring time : 1 min max. (ref.item 9.3) 7.3 Withstanding Products shall not be damaged. Test Voltage : 2.5 times for Rated Voltage Voltage Time : 1 to 5 s Charge Current : 1 mA max. (ref.item 9.2) 7.4 DC Resistance Meet item 3. Measuring current : 10mA max. (Rdc) (In case of doubt in the above mentioned standard condition, measure by 4 terminal method.) (ref.item 9.4) 8. Q200 Requirement 8-1. Performance AEC-Q200 Rev.D issued June 1. 2010 AEC-Q200 Murata Specification / Deviation Stress Test Method No. High Temperature 1000h at 125 deg C Meet Table A after testing. 3 Exposure Set for 24h at room temperature, Table A then measured. Appearance No damaged Common Mode Inductance Change Within 20% (at 0.1MHz) 4 Temperature Cycling 1000cycles Meet Table A after testing. -40 deg C to +125 deg C Set for 24h at room temperature, then measured. 5 Destructive Per EIA469 Not Applicable Physical Analysis No electrical tests 7 Biased Humidity 1000h at 85 deg C, 85%RH Meet Table A after testing. Apply rated current (ref.item 9.5) 8 Operational Life 1000h at 125 deg C Meet Table A after testing. Apply rated current Set for 24h at room temperature, (ref.item 9.6) then measured Visual inspection 9 External Visual No abnormalities 10 Physical Dimension Meet ITEM 4 No defects Style and Dimensions 12 Resistance to Solvents Per MIL-STD-202 Method 215 Not Applicable 13 Mechanical Shock Per MIL-STD-202 Method 213 Meet Table A after testing. Conditon F: 1500gs(14.7N)/0.5ms/Half sine 14 Vibration 5g s(0.049N) for 20 min, Meet Table A after testing. 12cycles each of 3 oritentations Test from 10-2000Hz. 15 Resistance No-heating Pre-heating:150 to 180C / 9030s to Soldering Heat Solder temperature Meet Table A after testing. 260C+/-5 deg C Immersion time 10s