Chip Monolithic Ceramic Capacitor MLSC Serial for Automotive GCD216R71H562KA01 (0805, X7R:EIA, 5600pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor MLSC Serial used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCD 21 6 R7 1H 562 K A01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 2.00.15 1.250.15 0.60.1 0.2 to 0.7 0.7 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7R(EIA) (5) Nominal Methods Rated Capacitance Capacitance (Operating Temp. coeff Temp. Range Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C -15 to 15 % DC 50 V 5600 pF 10 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 4000 pcs./Reel PAPER W8P4 f330mm Reel J 10000 pcs./Reel PAPER W8P4 Product specifications in this catalog are as of Jun.6,2016,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCD216R71H562KA01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy Solder the capacitor on the test board (glass epoxy board). Exposure (Storage) the specifications in the following table. Set the capacitor for 100012h at 1503 . Appearance No marking defects Set for 242h at room temperature, then measure. Capacitance R7 : Within 10.0% Change D.F. R7 : 0.03 max. I.R. More than 10,000M or 500F (Whichever is smaller) 3 Temperature Cycling The measured and observed characteristics should satisfy Solder the capacitor on the test board (glass epoxy board). the specifications in the following table. Perform cycle test according to the four heat treatments listed Appearance No marking defects in the following table. Set for 242 hours at room temperature, Capacitance R7 : Within 10.0% then measure. Change Cycles Step Time(min) D.F. R7 : 0.03 max. 1000 1 153 -55+0/-3(for R7) 2 1 Room I.R. More than 10,000M or 500F 3 153 125+3/-0(for R7) (Whichever is smaller) 4 1 Room Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for 1h and then set for 242h at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy Solder the capacitor on the test board (glass epoxy board). Apply the 24h heat (25 to 65 ) and humidity (80 to 98%) the specifications in the following table. treatment shown below, 10 consecutive times. Appearance No marking defects Set for 242h at room temperature, then measure. Capacitance R7 : Within 12.5% Change Humidity Humidity Temperature 8098% 8098% Humidity Humidity Humidity () 9098% 9098% 9098% 70 D.F. R7 : 0.03 max. 65 60 55 50 45 40 35 30 I.R. More than 10,000M or 500F 25 +10 20 (Whichever is smaller) - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy Biased Humidity Solder the capacitor on the test board (glass epoxy board). the specifications in the following table. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) at 853 and 80 to 85% humidity for 100012h. Appearance No marking defects Remove and set for 242h at room temperature, then measure. Capacitance R7 : Within 12.5% The charge/discharge current is less than 50mA. Change D.F. R7 : 0.035 max. I.R. More than 1,000M or 50F (Whichever is smaller) JEMCGS-00806C 2