X-On Electronics has gained recognition as a prominent supplier of GCG155L81C473KA01D Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GCG155L81C473KA01D Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GCG155L81C473KA01D Murata

GCG155L81C473KA01D electronic component of Murata
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Part No.GCG155L81C473KA01D
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Murata Electronics Multilayer Ceramic Capacitors MLCC - SMDSMT 0402 0.047uF 16volts X8L 10%
Datasheet: GCG155L81C473KA01D Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.2134 ea
Line Total: USD 0.21 
Availability - 0
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
0
Ship by Thu. 28 Nov to Wed. 04 Dec
MOQ : 10000
Multiples : 10000
10000 : USD 0.0836
20000 : USD 0.0835
30000 : USD 0.0833
40000 : USD 0.0831
50000 : USD 0.083
100000 : USD 0.0828
150000 : USD 0.0825
250000 : USD 0.0824
500000 : USD 0.0823

0
Ship by Tue. 26 Nov to Thu. 28 Nov
MOQ : 1
Multiples : 1
1 : USD 0.2134
10 : USD 0.0891
100 : USD 0.0594
1000 : USD 0.0528
2500 : USD 0.0451
10000 : USD 0.0385
20000 : USD 0.0374
50000 : USD 0.0363
100000 : USD 0.0352

   
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We are delighted to provide the GCG155L81C473KA01D from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GCG155L81C473KA01D and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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Chip Monolithic Ceramic Capacitor for Automotive limited to Conductive Glue Mounting GCG155L81C473KA01 (0402, X8L:, 47000pF, DC16V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor limited to Conductive Glue Mounting Type used for Automotive Electronic equipment with conductive glue mounting. 2.MURATA Part NO. System (Ex.) GCG 15 5 L8 1C 473 K A01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.00.1 0.50.05 0.50.05 0.15 to 0.35 0.3 min. 4.Rated value Specifications and Test (4) (6) (3) Temperature Characteristics (5) Nominal Methods Rated Capacitance Capacitance (Operating Temp. coeff Temp. Range Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 150 C -40 to 15 % DC 16 V 47000 pF 10 % -55 to 150 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 10000 pcs./Reel PAPER W8P2 f180mm Reel W 20000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Apr.15,2016,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCG155L81C473KA01-01 1AEC-Q200 Murata Standard Specification and Test Methods Specification. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and Exposure (Storage) specifications in the following table. under the same conditions as No.16. Appearance No marking defects Set the capacitor for 100012 hours at 1503 . Set for Capacitance Within 2.5% or 0.25pF R7/L8/R9:Within 12.5% 242 hours at room temperature, then measure. Change (Whichever is larger) Q/D.F. 30pFmin. : Q1000 R7/L8 : 0.05 max. 30pFmax.: Q 400+20C R9 : 0.075max. C: Nominal Capacitance(pF) I.R. More than 10,000M or 500 F R9 : More than 3,000M or 150 F (Whichever is smaller) 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and specifications in the following table. under the same conditions as No.16. Perform the 1000 cycles Appearance No marking defects according to the four heat treatments listed in the following table. Capacitance Within 2.5% or 0.25pF R7/L8/R9: Within 10.0% Set for 24 2 hours at room temperature, then measure Step 1 2 3 4 Change (Whichever is larger) Q/D.F. Temp. Room 125+3/-0(for C/R7) Room 30pFmin.: Q 1000 R7/L8 W.V.: 25Vmin.: 0.03 max. -55+0/-3 ( C) Temp. 150+3/-0(for 5G/L8/R9) Temp. 30pFmax.: Q 400+20C W.V.: 16V : 0.05 max Time C: Nominal Capacitance (pF) R9 : 0.075max. 15 3 1 153 1 (min.) I.R. More than 10,000M or 500 F (Whichever is smaller) Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and specifications in the following table. under the same conditions as No.16. Apply the 24-hour heat (25 to 65 ) and humidity (80 to 98%) treatment shown below, 10 consecutive times. Set for 24 2 hours at room temperature, then measure. Appearance No marking defects Humidity Humidity Capacitance Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Temperature 8098% 80 98% Humidity Humidity Humidity Change (Whichever is larger) () 90 98% 9098% 9098% 70 Q/D.F. 30pFmin. : Q350 R7/L8 : 0.05 max. 65 60 10pF and over, 30pF and below: 55 50 Q275+5C/2 R9 : 0.075max. 45 10pFmax.: Q 200+10C 40 35 C: Nominal Capacitance(pF) 30 25 I.R. More than 10,000M or 500 F +10 20 - 2 R9 : More than 3,000M or 150 F 15 10 5 Initial measuremt 0 (Whichever is smaller) -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Biased Humidity Fix the capacitor to the supporting jig in the same manner and specifications in the following table. under the same conditions as No.16. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) Appearance No marking defects at 853 and 80 to 85% humidity for 100012 hours. Capacitance Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Remove and set for 242 hours at room temperature, then measure. Change (Whichever is larger) The charge/discharge current is less than 50mA. Q/D.F. 30pF and over: Q200 R7/L8 : 0.05 max. 30pF and below: Q100+10C/3 R9 : 0.075max. C: Nominal Capacitance(pF) I.R. More than 1,000M or 50 F (Whichever is smaller) JEMCGS-01499C 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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