GCJ31CL81E105KA01L Murata

Only Reflow Soldering CHIP MONOLITHIC CERAMIC CAPACITOR SOFT TERMINATION TYPE FOR AUTOMOTIVE GCJ31CL81E105KA01 (1206, X8L, 1uF, 25Vdc) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor Soft Termination Type used for Automotive Electronic equipment. This product is applied for Only Reflow Soldering. 2.MURATA Part NO. System (Ex.) GCJ 31 C L8 1E 105 K A01 L (1)L/W (2)T (3)Temperature (4)DC Rated (5)Nominal (6)Capacitance (7)Muratas (8)Packaging Dimensions Characteristics Voltage Capacitance Tolerance Control Code Code Dimensions 3. Type & Dimensions L W T e g e (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.3 1.60.3 1.60.3 0.3 to 1.0 1.5 min. 4.Rated value Specifications and Test (4) (6) (3) Temperature Characteristics (5) Nominal Methods DC Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 150 C 25 Vdc 1 uF 10 % -40 to 15 % -55 to 150 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 2000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 6000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of Jun.12,2013,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCJ31CL81E105KA01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 100012 hours at 1503. Set for Exposure (Storage) specifications in the following table. 242 hours at room temperature, then measure. Appearance No marking defects Capacitance L8 : Within 12.5% Change D.F. L8 : 0.05 max. I.R. More than 10,000M or 500 F (Whichever is smaller) 3 Temperature Cycling Fix the capacitor to the supporting jig in the same manner and under The measured and observed characteristics should satisfy the the same conditions as (19). Perform the 1000 cycle test according specifications in the following table. Appearance No marking defects to the four heat treatments listed in the following table. Set for 242 hours at room temperature, then measure Capacitance 8 : Within 7.5% Change 3 4 Step 1 2 D.F. 8 : 0.05 max. Temp. Room 150+3/-0 Room -55+0/-3 () Temp. (for L8) Temp. Time I.R. 153 1 153 1 More than 10,000M or 500 F (min.) (Whichever is smaller) Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Phisical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Apply the 24-hour heat (25 to 65) and humidity (80 to 98%) specifications in the following table. treatment shown below, 10 consecutive times. Set for 242 hours at room temperature, then measure. Appearance No marking defects Humidity Humidity Temperature Capacitance L8 : Within 10.0% 8098% 8098% Humidity Humidity Humidity () 9098% 9098% 9098% Change 70 65 L8 : 0.05 max. D.F. 60 55 50 45 I.R. More than 10,000M or 500 F 40 35 (Whichever is smaller) 30 25 +10 20 - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 Biased Humidity The measured and observed characteristics should satisfy the Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) specifications in the following table. at 853 and 80 to 85% humidity for 100012 hours. Remove and set for 242 hours at room temprature, then measure. Appearance No marking defects Capacitance L8 : Within 12.5% The charge/discharge current is less than 50mA. Change L8 : 0.05 max. D.F. I.R. More than 1,000M or 50 F (Whichever is smaller) JEMCGS-02174 2