Chip Multilayer Ceramic Capacitors for Automotive GCM3195G1H113JA16 (1206, X8G:MURATA, 11000pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 31 9 5G 1H 113 J A16 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.15 1.60.15 0.850.1 0.3 to 0.8 1.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X8G(MURATA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 150 C 030 ppm/C DC 50 V 11000 pF 5 % -55 to 150 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 4000 pcs./Reel PAPER W8P4 f330mm Reel J 10000 pcs./Reel PAPER W8P4 Product specifications in this catalog are as of May.30,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM3195G1H113JA16-01 1AEC-Q200 Murata Standard Specification and Test Methods Specification. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-10.0% Initial measurement for high dielectric constant type Change (Whichever is larger) Perform a heat treatment at 150+0/-10 for 1h and then sit Q or D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin. : 0.03 max. for 24+/-2h at room temperature.Perform the initial measurement. 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. 5C/5G/R7/L8 : More than 10,000M or 500F(Whichever is smaller) 25 R9 : More than 3000M or 150 F(Whichever is smaller) 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform cycle test according to the four heat treatments listed Appearance No marking defects in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-10.0% Cycles Step Time(min) Change (Whichever is larger) 1000(for C/R7) 300(for 5G/L8/R9) 1 15+/-3 -55+0/-3 -55+0/-3 2 1 Room Room Q or D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin. : 0.03 max. 3 15+/-3 125+3/-0 150+3/-0 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. 4 1 Room Room C: Nominal Capacitance(pF) R9 : 0.075 max. Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for 1h and then sit I.R. More than 10,000M or 500F for 24+/-2h at room temperature.Perform the initial measurement. 25 (Whichever is smaller) 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65) and humidity (80%RH to 98%RH) treatment shown below, 10 consecutive times. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-3.0% or +/-0.30pF Within +/-12.5% Humidity Humidity Temperature Change (Whichever is larger) 8098% 8098% Humidity Humidity Humidity () 9098% 9098% 9098% 70 65 Q or D.F. 30pFmin. : Q350 R7/L8 : W.V.: 35Vmin.: 0.03 max. 60 55 10pF and over, 30pF and below: W.V.: 25Vmax. : 0.05 max. 50 Q275+5C/2 R9 : 0.075max. 45 40 10pFmax.: Q 200+10C 35 30 C: Nominal Capacitance(pF) 25 +10 20 - 2 15 I.R. 5C/5G/R7/L8 : More than 10,000M or 500F(Whichever is smaller) 10 5 Initial measuremt 25 R9 : More than 3000M or 150 F(Whichever is smaller) 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature.Perform the initial measurement. 6 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No marking defects The charge/discharge current is less than 50mA. Remove and set for 24+/-2h at room temperature, then measure. Capacitance Within +/-3.0% or +/-0.30pF Within +/-12.5% Change (Whichever is larger) Initial measurement for high dielectric constant type Q or D.F. 30pF and over: Q200 R7/L8 W.V.: 35Vmin.: 0.035 max.* Perform a heat treatment at 150+0/-10 for 1h and then sit 30pF and below: Q100+10C/3 * GCM188L81H221 to 103 : 0.05 max. for 24+/-2h at room temperature.Perform the initial measurement. C: Nominal Capacitance(pF) W.V.: 25Vmax. : 0.05 max. R9 : 0.075max. I.R. More than 1,000M or 50F 25 (Whichever is smaller) JEMCGS-0363V 2