X-On Electronics has gained recognition as a prominent supplier of GCM32DR71H335KA55L Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GCM32DR71H335KA55L Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GCM32DR71H335KA55L Murata

GCM32DR71H335KA55L electronic component of Murata
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Part No.GCM32DR71H335KA55L
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Multilayer Ceramic Capacitors MLCC - SMD/SMT SMALLER ALTERNATIVE 81-GCM31CC71H475KA3L. SEE DATASHEET TO VERIFY FOR YOUR APP.
Datasheet: GCM32DR71H335KA55L Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.9378 ea
Line Total: USD 0.94 
Availability - 0
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
0
Ship by Fri. 29 Nov to Thu. 05 Dec
MOQ : 1000
Multiples : 1000
1000 : USD 1.392
2000 : USD 1.3906

0
Ship by Fri. 06 Dec to Wed. 11 Dec
MOQ : 1
Multiples : 1
1 : USD 0.9378
10 : USD 0.7934
30 : USD 0.7202
100 : USD 0.649
500 : USD 0.6059
1000 : USD 0.5833

0
Ship by Wed. 27 Nov to Fri. 29 Nov
MOQ : 1
Multiples : 1
1 : USD 2.783
10 : USD 1.98
50 : USD 1.595
100 : USD 1.485
500 : USD 1.287
1000 : USD 1.199
2000 : USD 1.155
5000 : USD 1.155

0
Ship by Fri. 29 Nov to Thu. 05 Dec
MOQ : 36
Multiples : 1
36 : USD 1.759

0
Ship by Fri. 29 Nov to Thu. 05 Dec
MOQ : 8
Multiples : 1
8 : USD 1.3427
10 : USD 1.2647
25 : USD 1.0934
100 : USD 1.0005
250 : USD 0.9805

   
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We are delighted to provide the GCM32DR71H335KA55L from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GCM32DR71H335KA55L and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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CHIP MONOLITHIC CERAMIC CAPACITOR FOR AUTOMOTIVE GCM32DR71H335KA55 (1210, X7R, 3.3uF, 50Vdc) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 32 D R7 1H 335 K A55 L (1)L/W (2)T (3)Temperature (4)DC Rated (5)Nominal (6)Capacitance (7)Muratas (8)Packaging Dimensions Characteristics Voltage Capacitance Tolerance Control Code Code Dimensions 3. Type & Dimensions L W T e g e (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.3 2.50.2 2.00.2 0.3 min. 1.0 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7R(EIA) (5) Nominal Methods DC Rated Capacitance (Operationg Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C 50 Vdc 3.3 uF 10 % -15 to 15 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 1000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 4000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of Jan.26,2013,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM32DR71H335KA55-01 1AEC-Q200 Murata Standard Specification and Test Methods Specification. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 100012 hours at 1503. Set for Exposure (Storage) specifications in the following table. 242 hours at room temperature, then measure. Appearance No marking defects Capacitance Within 2.5% or 0.25pF R7/L8/R9: Within 10.0% Change (Whichever is larger) Q/D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin.: 0.03 max. 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 10,000M or 500 F (Whichever is smaller) R9 : More than 150 F 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under specifications in the following table. the same conditions as (19). Perform cycle test according to the four Appearance No marking defects heat treatments listed in the following table. Set for 242 hours at Capacitance Within 2.5% or 0.25pF R7/L8/R9: Within 10.0% room temperature, then measure Change (Whichever is larger) Cycles Q/D.F. 30pFmin. : Q1000 R7/L8 W.V.: 25Vmin.: 0.03 max. Step Time(min) 1000(for C/R7) 300(for 5G/L8/R9) 30pFmax.: Q 400+20C W.V.: 16V/10V : 0.05 max. 1 153 -55+0/-3 -55+0/-3 C: Nominal Capacitance(pF) R9 : 0.05max. 2 1 Room Room 3 153 125+3/-0 150+3/-0 I.R. More than 10,000M or 500 F 4 1 Room Room (Whichever is smaller) Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Phisical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Apply the 24-hour heat (25 to 65) and humidity (80 to 98%) specifications in the following table. treatment shown below, 10 consecutive times. Set for 242 hours at room temperature, then measure. Appearance No marking defects Capacitance Humidity Humidity Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Temperature 8098% 8098% Humidity Humidity Humidity Change (Whichever is larger) () 9098% 9098% 9098% 70 Q/D.F. 30pFmin. : Q350 R7/L8 : W.V.: 25Vmin.: 0.03 max. 65 60 10pF and over, 30pF and below: W.V.: 16V/10V : 0.05 max. 55 50 Q275+5C/2 R9 : 0.075max. 45 10pFmax.: Q 200+10C 40 35 C: Nominal Capacitance(pF) 30 25 I.R. More than 10,000M or 500 F +10 20 - 2 15 (Whichever is smaller) 10 R9 : More than 150 F 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) Biased Humidity specifications in the following table. at 853 and 80 to 85% humidity for 100012 hours. Remove and set for 242 hours at room temprature, then measure. Appearance No marking defects The charge/discharge current is less than 50mA. Capacitance Within 3.0% or 0.30pF R7/L8/R9: Within 12.5% Change (Whichever is larger) Q/D.F. 30pF and over: Q200 R7/L8 W.V.: 25Vmin.: 0.035 max. 30pF and below: Q100+10C/3 W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 1,000M or 50 F (Whichever is smaller) JEMCGS-0363S 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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