X-On Electronics has gained recognition as a prominent supplier of GCQ1555C1HR56WB01D Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GCQ1555C1HR56WB01D Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GCQ1555C1HR56WB01D Murata

GCQ1555C1HR56WB01D electronic component of Murata
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Part No.GCQ1555C1HR56WB01D
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Multilayer Ceramic Capacitors MLCC - SMDSMT 0402 50VDC 0.56pF 0.05pF AEC-Q200
Datasheet: GCQ1555C1HR56WB01D Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.242 ea
Line Total: USD 0.24 
Availability - 9007
Ship by Wed. 25 Dec to Fri. 27 Dec
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
9007
Ship by Wed. 25 Dec to Fri. 27 Dec
MOQ : 1
Multiples : 1
1 : USD 0.242
10 : USD 0.1595
100 : USD 0.1023
1000 : USD 0.0748
2500 : USD 0.0715
10000 : USD 0.0682
20000 : USD 0.066
50000 : USD 0.0638
100000 : USD 0.0627

   
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We are delighted to provide the GCQ1555C1HR56WB01D from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GCQ1555C1HR56WB01D and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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Only Reflow Soldering High Q Chip Multilayer Ceramic Capacitors for Automotive GCQ1555C1HR56WB01 (0402, C0G:EIA, 0.56pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to High Q Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. This product is applied for Only Reflow Soldering. 2.MURATA Part NO. System (Ex.) GCQ 15 5 5C 1H R56 W B01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.00.05 0.50.05 0.50.05 0.15 to 0.35 0.3 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):C0G(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 125 C 030 ppm/C DC 50 V 0.56 pF 0.05 pF -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 10000 pcs./Reel PAPER W8P2 f180mm Reel W 20000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Jul.12,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCQ1555C1HR56WB01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within 2.5% or 0.25pF (Whichever is larger) Change Q Within the specified initial value. I.R. More than 10,000M or 500 F(Whichever is smaller) 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). specifications in the following table. Perform 1000 cycle test according to the four heat treatments listed Appearance No marking defects in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within 2.5% or 0.25pF (Whichever is larger) Step Time(min) Temp.() Change Q Within the specified initial value. 1 153 -55+0/-3 2 1 Room 3 153 125+3/-0 I.R. More than 10,000M or 500 F(Whichever is smaller) 4 1 Room 25 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65 ) and humidity (80 to 98%) treatment shown below, 10 consecutive times. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within 3.0% or 0.30pF (Whichever is larger) Humidity Humidity Change Temperature 8098% 80 98% Humidity Humidity Humidity () Q 30pFmin. : Q350 90 98% 9098% 9098% 70 10pF and over, 30pF and below : Q275+5C/2 65 60 10pFmax. : Q 200+10C 55 50 C: Nominal Capacitance(pF) 45 40 35 I.R. More than 10,000M or 500 F(Whichever is smaller) 30 25 25 20 +10 - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No marking defects The charge/discharge current is less than 50mA. Remove and set for 24+/-2h at room temperature, then measure. Capacitance Within 3.0% or 0.30pF (Whichever is larger) Change Q 30pF and over : Q200 30pF and below : Q100+10C/3 C: Nominal Capacitance(pF) I.R. More than 1,000M or 50 F (Whichever is smaller) 25 JEMCGS-04995B 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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