GRM0225C1H430GA02D Murata

Chip Multilayer Ceramic Capacitors for General Purpose GRM0225C1H430GA02 (0402M(01005), C0G(EIA), 43pF, DC 50V) :Package Reference Sheet Product specifications in this catalog are as of Oct.23,2021, and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. MURATA Part No. System (Ex.) GRM 02 2 5C 1H 430 G A02 L Series Dimension Dimension Temperature Rated Capacitance Capacitance Individual Package (LW) (T) Characteristics Voltage Tolerance Specification Type & Dimension image:Dimension Size Code 0402M(01005) (in mm) L W T e g 0.4+/-0.02 0.2+/-0.02 0.2+/-0.02 0.07 to 0.14 0.13 min. Rated Value Temperature Characteristics 5C (Public STD Code C0G(EIA) ) Rated Mounting Operating Temp. Range Capacitance Method Voltage Capacitance Temp. coeff. or Cap. Change Temp. Range Ref.Temp. Tolerance 0+/-30 ppm/ 25 to 125 25 DC 50V 43pF +/-2% -55 to 125 Reflow Individual Specification : This denotes Murata control code. Package Package Packaging Standard Packing Quantity L 180mm Reel Plastic Tape W4P1 40000 pcs./Reel GRM0225C1H430GA02-01A 1 Specifications and Test Methods No Item Specification Test Method(Ref. Standard:JIS C 5101, IEC60384 Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. 1 Rated Voltage When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak), whichever is larger, should be maintained within the rated voltage range. 2 Appearance No defects or abnormalities. Visual inspection 3 Dimension Shown in Dimension. Using Measuring instrument of dimension. 4 Voltage proof No defects or abnormalities. Measurement Point Between the terminations Test Voltage 300% of the rated voltage Applied Time 1s to 5s Charge/discharge current 50mA max. More than 10000M Measurement Temperature Room Temperature 5 Insulation Resistance(I.R.) Measurement Point Between the terminations (Room Temperature) Measurement Voltage Rated Voltage Charging Time 1min Charge/discharge current 50mA max. 6 Capacitance Shown in Rated value. Measurement Temperature Room Temperature Measurement Frequency 1.0+/-0.1MHz Measurement Voltage 0.5 to 5.0Vrms Measurement Temperature 7 Q or Dissipation Factor Q 1000 Room Temperature (D.F.) Measurement Frequency 1.0+/-0.1MHz Measurement Voltage 0.5 to 5.0Vrms 8 Temperature No bias Nominal values of the temperature coefficientis is The capacitance change should be measured after 5 min at each specified temp. stage. Characteristics of shown in Rated value. But, the Capacitance Change Capacitance value as a reference is the value in marked step. Capacitance under Reference Temperature is shown inTable A. Capacitance Drift The capacitance drift is calculated by dividing the differences between the maximum and minimum Capacitance Drift: Within +/-0.2% or +/-0.05pF measured values in the step 1,3 and 5 by the cap. value in step 3. (Whichever is larger.) Measurement Voltage Less than 1.0Vrms (Refer to the individual data sheet) Temperature Step No removal of the terminations or other defect should occur. Mounting method Solder the capacitor on the test substrate 9 Adhesive Strength of Termination Applied Force 1N Holding Time 10+/-1s Applied Direction In parallel with the test substrate and vertical with the capacitor side GRM0225C1H430GA02-01A 2