Chip Multilayer Ceramic Capacitors for General Purpose GRM1555C1H822JE01 (1005M(0402), C0G(EIA), 8200pF, DC 50V) :Packaging Code Reference Sheet Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. MURATA Part No. System (Ex.) GRM 15 5 5C 1H 822 J E01 D L/W T Temperature Rated Nominal Capacitance Muratas Packaging Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Control Code Code Type & Dimensions image:Dimensions 1005M(0402) (in mm) Size Code L W T e g 1.0+/-0.15 0.5+/-0.15 0.5+/-0.15 0.15 to 0.35 0.3 min. Rated Value Temperature Characteristics 5C (Public STD Code C0G(EIA) ) Rated Nominal Capacitance Mounting Operating Temp. Range Method Voltage Capacitance Tolerance Temp. coeff. or Cap. Change Temp. Range Ref.Temp. 0+/-30 ppm/ 25 to 125 25 DC 50V 8200pF +/-5% -55 to 125 Reflow Package Code Packaging Standard Packing Quantity D 180mm Reel PAPER Tape W8P2 10000 pcs./Reel J 330mm Reel PAPER Tape W8P2 40000 pcs./Reel Product specifications in this catalog are as of Apr.22,2021, and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRM1555C1H822JE01-01A 1 Specifications and Test Methods No Item Specification Test Method(Ref. Standard:JIS C 5101, IEC60384 1 Rated Voltage Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak), whichever is larger, should be maintained within the rated voltage range. 2 Appearance No defects or abnormalities. Visual inspection. 3 Dimension Shown in Rated value. Using Measuring instrument of dimension. 4 Voltage proof No defects or abnormalities. Measurement Point Between the terminations Test Voltage 300% of the rated voltage Applied Time 1s to 5s Charge/discharge current 50mA max. 5 Insulation More than 10000M Measurement Temperature Room Temperature Resistance(I.R.) Measurement Point Between the terminations (Room Temperature) Measurement Voltage Rated Voltage Charging Time 1min Charge/discharge current 50mA max. 6 Capacitance Shown in Rated value. Measurement Temperature Room Temperature Measurement Frequency 1.0+/-0.1kHz Measurement Voltage 1.0+/-0.2Vrms 7 Q or Dissipation Factor Q 1000 Measurement Temperature Room Temperature (D.F.) Measurement Frequency 1.0+/-0.1kHz Measurement Voltage 1.0+/-0.2Vrms 8 Temperature No bias Nominal values of the temperature coefficientis is The capacitance change should be measured after 5 min at each specified temp. stage. Characteristics of shown in Rated value. But, the Capacitance Change Capacitance value as a reference is the value in marked step. Capacitance under Reference Temperature is shown inTable A. Capacitance Drift The capacitance drift is calculated by dividing the differences between the maximum and minimum Capacitance Drift: Within +/-0.2% or +/-0.05pF measured values in the step 1,3 and 5 by the cap. value in step 3. (Whichever is larger.) Measurement Voltage Less than 1.0Vrms (Refer to the individual data sheet) Temperature Step 9 Adhesive Strength of No removal of the terminations or other defect should occur. Mounting method Solder the capacitor on the test substrate Termination Applied Force 5N Holding Time 10+/-1s Applied Direction In parallel with the test substrate and vertical with the capacitor side GRM1555C1H822JE01-01A 2