Chip Multilayer Ceramic Capacitors for General Purpose
GRM1881X1H562JA01_(0603,SL(JIS),5600pF,DC 50 V)
_:Packaging Code
Reference Sheet
Scope
This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment.
MURATA Part No. System
(Ex.)
GRM 18 8 1X 1H 562 J A01 D
(1)L/W (2)T (3)Temperature (4)Rated (5)Nominal
(8)Packaging
(6)Capacitance (7)Muratas
Dimensions Dimensions Characteristics Voltage Code
Capacitance
Tolerance Control Code
Type
Rated Value
(1)Size Code : 0603
(3)Temperature Characteristics :1X(Public STD Code :SL(JIS))
Dimensions(mm) (3)Temperature Characteristics
(4)Rated (5)Nominal (6)Capacitance Operating Mounting
MURATA PART NO.
Temp. coeff
Voltage Capacitance Tolerance Temp. Range Method
(1)-1 L (1)-2 W (2) T e g Temp. Range Ref.Temp.
or Cap. Change
1.6
0.8
0.8
0.2
Flow,
GRM1881X1H562JA01_ 0.5 min. -1000 to 350 ppm/ 20 to 85 20 DC 50 V 5600pF +/-5 % -55 to 125
+/-0.1 +/-0.1 +/-0.1 to 0.5 Reflow
Package
(8)Code Packaging Packaging Unit
180mm Reel
D 4000 pcs./Reel
PAPER Tape W8P4
330mm Reel
J 10000 pcs./Reel
PAPER Tape W8P4
Product specifications in this catalog are as of Nov.21,2017,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GRM1881X1H562JA01-01A Specifications and Test Methods
Item Specification Test Method (Ref. Standard:JIS C 5101, IEC60384)
No.
1 Rated Voltage Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor.
P-P O-P
When AC voltage is superimposed on DC voltage, V or V , whichever is larger, should be maintained
within the rated voltage range.
2 Appearance No defects or abnormalities. Visual inspection.
3 Dimension Shown in Rated value. Using Measuring instrument of dimension.
4 Voltage Proof No defects or abnormalities. Measurement Point : Between the terminations
Test Voltage : 300% of the rated voltage
Applied Time : 1s to 5s
Charge/Discharge Current : 50mA max.
5 Insulation Resistance(I.R.) More than 10000M Measurement Temperature: Room Temperature
Measurement Point : Between the terminations
Measurement Voltage : Rated Voltage
Charging Time : 2min
Charge/Discharge Current : 50mA max.
6 Capacitance Shown in Rated value. Measurement Temperature: Room Temperature
Measurement Frequency : 1.0+/-0.1kHz
Measurement Voltage : 1.0+/-0.2Vrms
7 Q or Dissipation Factor (D.F.) Q 1000 Measurement Temperature : Room Temperature
Measurement Frequency : 1.0+/-0.1kHz
Measurement Voltage : 1.0+/-0.2Vrms
8 Capacitance No bias Nominal value of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 minutes at each specified temperature stage.
Temperature But, the Capacitance Change under Reference Temperature is shown in
Table A.
Characteristics
Capacitance value as a reference is the value in marked step.
Capacitance Drift:Within +/-0.2% or +/-0.05pF (Whichever is larger) The capacitance drift is calculated by dividing the differences between the maximum and minimum measured values in the step 1,3 and 5 by the capacitance
value in step 3.
Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet)
Step Temperature(C) Applying Voltage
1 Reference Temp. +/-2
2 Min. Operating Temp. +/-3
No bias
3 * Reference Temp. +/-2
4 Max. Operating Temp. 3
5 Reference Temp. +/-2
GRM1881X1H562JA01-01A
Step Temperature() Time (min)
1 Min.Operating Temp. +0/-3 30+/-3
2 Reference Temp. 2 to 3
3 Max.Operating Temp. +3/-0 30+/-3
4 Reference Temp. 2 to 3