Chip Multilayer Ceramic Capacitors for General Purpose GRM31CC81A476ME44 (3216M(1206), X6S(EIA), 47uF, DC 10V) :Package Reference Sheet Product specifications in this catalog are as of Nov.4,2021, and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. MURATA Part No. System (Ex.) GRM 31 C C8 1A 476 M E44 L Series Dimension Dimension Temperature Rated Capacitance Capacitance Individual Package (LW) (T) Characteristics Voltage Tolerance Specification Type & Dimension image:Dimension Size Code 3216M(1206) (in mm) L W T e g 3.2+/-0.3 1.6+/-0.3 1.6+/-0.3 0.3 to 0.8 1.5 min. Rated Value Temperature Characteristics C8 (Public STD Code X6S(EIA) ) Rated Mounting Operating Temp. Range Capacitance Method Voltage Capacitance Temp. coeff. or Cap. Change Temp. Range Ref.Temp. Tolerance -22 to 22 % -55 to 105 25 DC 10V 47uF +/-20% -55 to 105 Flow, Reflow Individual Specification : This denotes Murata control code. Package Package Packaging Standard Packing Quantity L 180mm Reel Plastic Tape W8P4 2000 pcs./Reel K 330mm Reel Plastic Tape W8P4 6000 pcs./Reel GRM31CC81A476ME44-01A 1 Specifications and Test Methods No Item Specification Test Method(Ref. Standard:JIS C 5101, IEC60384 Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. 1 Rated Voltage When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak), whichever is larger, should be maintained within the rated voltage range. 2 Appearance No defects or abnormalities. Visual inspection 3 Dimension Shown in Dimension. Using Measuring instrument of dimension. 4 Voltage proof No defects or abnormalities. Measurement Point Between the terminations Test Voltage 250% of the rated voltage Applied Time 1s to 5s Charge/discharge current 50mA max. More than 50 F Measurement Temperature Room Temperature 5 Insulation Resistance(I.R.) Measurement Point Between the terminations (Room Temperature) Measurement Voltage Rated Voltage Charging Time 1min Charge/discharge current 50mA max. 6 Capacitance Shown in Rated value. Measurement Temperature Room Temperature Measurement Frequency 120+/-24Hz Measurement Voltage 0.5+/-0.1Vrms Pre-treatment Heat treatment:Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. DF 0.1 Measurement Temperature Room Temperature 7 Q or Dissipation Factor (D.F.) Measurement Frequency 120+/-24Hz Measurement Voltage 0.5+/-0.1Vrms No bias Shown in Rated value. The capacitance change should be measured after 5 min at each specified temp. stage. 8 Temperature Characteristics of Capacitance value as a reference is the value in marked step. Capacitance Measurement Voltage Less than 1.0Vrms (Refer to the individual data sheet) Pre-treatment Heat treatment:Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Temperature Step 9 Adhesive Strength of No removal of the terminations or other defect should occur. Mounting method Solder the capacitor on the test substrate Termination Applied Force 10N Holding Time 10+/-1s Applied Direction In parallel with the test substrate and vertical with the capacitor side GRM31CC81A476ME44-01A 2