GRM32ER71K475ME14L Murata

Chip Multilayer Ceramic Capacitors for General Purpose GRM32ER71K475ME14 (3225M(1210), X7R(EIA), 4.7uF, DC 80V) :Package Reference Sheet Product specifications in this catalog are as of Nov.4,2021, and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. MURATA Part No. System (Ex.) GRM 32 E R7 1K 475 M E14 L Series Dimension Dimension Temperature Rated Capacitance Capacitance Individual Package (LW) (T) Characteristics Voltage Tolerance Specification Type & Dimension image:Dimension Size Code 3225M(1210) (in mm) L W T e g 3.2+/-0.3 2.5+/-0.2 2.5+/-0.2 0.3 min. 1.0 min. Rated Value Temperature Characteristics R7 (Public STD Code X7R(EIA) ) Rated Mounting Operating Temp. Range Capacitance Method Voltage Capacitance Temp. coeff. or Cap. Change Temp. Range Ref.Temp. Tolerance -15 to 15% -55 to 125 25 DC 80V 4.7uF +/-20% -55 to 125 Reflow Individual Specification : This denotes Murata control code. Package Package Packaging Standard Packing Quantity L 180mm Reel Plastic Tape W8P4 1000 pcs./Reel K 330mm Reel Plastic Tape W8P4 4000 pcs./Reel GRM32ER71K475ME14-01A 1 Specifications and Test Methods No Item Specification Test Method(Ref. Standard:JIS C 5101, IEC60384 Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. 1 Rated Voltage When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak), whichever is larger, should be maintained within the rated voltage range. 2 Appearance No defects or abnormalities. Visual inspection 3 Dimension Shown in Dimension. Using Measuring instrument of dimension. 4 Voltage proof No defects or abnormalities. Measurement Point Between the terminations Test Voltage 250% of the rated voltage Applied Time 1s to 5s Charge/discharge current 50mA max. More than 50 F Measurement Temperature Room Temperature 5 Insulation Resistance(I.R.) Measurement Point Between the terminations (Room Temperature) Measurement Voltage Rated Voltage Charging Time 1min Charge/discharge current 50mA max. 6 Capacitance Shown in Rated value. Measurement Temperature Room Temperature Measurement Frequency 1.0+/-0.1kHz Measurement Voltage 1.0+/-0.2Vrms Measurement Temperature 7 Q or Dissipation Factor DF 0.1 Room Temperature (D.F.) Measurement Frequency 1.0+/-0.1kHz Measurement Voltage 1.0+/-0.2Vrms 8 Temperature No bias Shown in Rated value. The capacitance change should be measured after 5 min at each specified temp. stage. Characteristics of Capacitance value as a reference is the value in marked step. Capacitance Measurement Voltage Less than 1.0Vrms (Refer to the individual data sheet) Pre-treatment Heat treatment:Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Temperature Step No removal of the terminations or other defect should occur. Mounting method Solder the capacitor on the test substrate 9 Adhesive Strength of Termination Applied Force 10N Holding Time 10+/-1s Applied Direction In parallel with the test substrate and vertical with the capacitor side GRM32ER71K475ME14-01A 2