X-On Electronics has gained recognition as a prominent supplier of GRT0335C1H1R0CA02D Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GRT0335C1H1R0CA02D Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GRT0335C1H1R0CA02D Murata

GRT0335C1H1R0CA02D electronic component of Murata
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Part No.GRT0335C1H1R0CA02D
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Multilayer Ceramic Capacitors MLCC - SMDSMT
Datasheet: GRT0335C1H1R0CA02D Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.0935 ea
Line Total: USD 0.09 
Availability - 40031
Ship by Thu. 26 Dec to Mon. 30 Dec
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
40031
Ship by Thu. 26 Dec to Mon. 30 Dec
MOQ : 1
Multiples : 1
1 : USD 0.0935
10 : USD 0.011
100 : USD 0.0066
1000 : USD 0.0055
2500 : USD 0.0044
15000 : USD 0.0033

   
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RoHS - XON
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We are delighted to provide the GRT0335C1H1R0CA02D from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GRT0335C1H1R0CA02D and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment GRT0335C1H1R0CA02 (0201, C0G:EIA, 1pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 03 3 5C 1H 1R0 C A02 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 0.60.03 0.30.03 0.30.03 0.1 to 0.2 0.2 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):C0G(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 125 C 030 ppm/C DC 50 V 1 pF 0.25 pF -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 15000 pcs./Reel PAPER W8P2 f180mm Reel W 30000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Apr.5,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT0335C1H1R0CA02-01 1AEC-Q200 Murata Standard Specification and Test Methods Specifications. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Set the capacitor for 1000+/-12 hours at maximum operating Exposure (Storage) specifications in the following table. temperature +/-3. Appearance No marking defects Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-12.5% Change (Whichever is larger) Initial measurement for high dielectric constant type Q or D.F. 30pFmin. : Q 350 0.2 max. Perform a heat treatment at 150+0/-10 for 1hour and then sit 10pF and over, 30pF and below:Q275+5C/2 for 24+/-2 hours at room temperature. Perform the initial measurement. 10pFmax.: Q 200+10C C: Nominal Capacitance(pF) Insulation More than 10000M or 500F More than 500M or 25F Resistance (Whichever is smaller) (Whichever is smaller) 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Perform cycles test according to the four heat treatments specifications in the following table. in the following table. Appearance No marking defects Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-10.0% Cycles Change (Whichever is larger) Step Time(min) 1000 5 Q or D.F. 30pFmin. : Q1000 0.2 max. 1 15+/-3 -40+0/-3 -55+0/-3 30pFmax.: Q 400+20C 2 1 Room Room C: Nominal Capacitance(pF) 3 15+/-3 105+3/-0 125+3/-0 4 1 Room Room Insulation More than 10000M or 500F More than 1000M or 50F Initial measurement for high dielectric constant type Resistance (Whichever is smaller) (Whichever is smaller) 25 Perform a heat treatment at 150+0/-10 for 1hour and then sit for 24+/-2 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Phisical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) specifications in the following table. at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12 hours. Appearance No marking defects The charge/discharge current is less than 50mA. Capacitance Within +/-3.0% or +/-0.30pF Within +/-12.5% Change (Whichever is larger) Initial measurement for high dielectric constant type Q or D.F. 30pF and over: Q200 0.2 max. Perform a heat treatment at 150+0/-10 for 1hour and then sit 30pF and below: Q100+10C/3 for 24+/-2 hours at room temperature. Perform the initial measurement. C: Nominal Capacitance(pF) Measurement after test for high dielectric constant type Insulation More than 1000M or 50F More than 100M or 5F Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance (Whichever is smaller) (Whichever is smaller) for 24+/-2 hours at room temperature. Perform the initial measurement. 25 JEMCGS-05925 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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