GRT033C80J223KE01D Murata

AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment GRT033C80J223KE01 (0201, X6S:EIA, 22000pF, DC6.3V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 03 3 C8 0J 223 K E01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 0.60.03 0.30.03 0.30.03 0.1 to 0.2 0.2 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X6S(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 105 C -22 to 22 % DC 6.3 V 22000 pF 10 % -55 to 105 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 15000 pcs./Reel PAPER W8P2 f180mm Reel W 30000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Apr.5,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT033C80J223KE01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specifications. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12 hours at maximum operating Appearance No marking defects temperature +/-3. Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-12.5% Change Initial measurement Perform a heat treatment at 150+0/-10 for 1hour and then sit 0.2 max. D.F. for 24+/-2 hours at room temperature. Perform the initial measurement. Insulation More than 500M or 25 F (Whichever is smaller) Resistance 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects in the following table. Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-7.5% Step 1 2 3 4 Change Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 ( C) Temp. Temp. 0.2 max. D.F. Time 15+/-3 1 15+/-3 1 (min) Initial measurement Insulation Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance for 24+/-2 hours at room temperature. Perform the initial measurement. 25 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) Appearance No marking defects at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12 hours. The charge/discharge current is less than 50mA. Capacitance Within +/-12.5% Change Initial measurement Perform a heat treatment at 150+0/-10 for 1hour and then sit 0.2 max. D.F. for 24+/-2 hours at room temperature. Perform the initial measurement. Measurement after test Insulation More than 100M or 5 F (Whichever is smaller) Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance for 24+/-2 hours at room temperature. Perform the initial measurement. 25 JEMCGS-05924 2