GRT1555C1H750FA02D Murata

AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment GRT1555C1H750FA02 (0402, C0G:EIA, 75pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 15 5 5C 1H 750 F A02 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.00.05 0.50.05 0.50.05 0.15 to 0.35 0.3 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):C0G(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 125 C 030 ppm/C DC 50 V 75 pF 1 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 10000 pcs./Reel PAPER W8P2 f180mm Reel W 20000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Aug.10,2019,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT1555C1H750FA02-01 1AEC-Q200 Murata Standard Specification and Test Methods Specifications. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Set the capacitor for 1000+/-12 hours at maximum operating Exposure (Storage) specifications in the following table. temperature +/-3. Appearance No marking defects Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-12.5% Change (Whichever is larger) Initial measurement for high dielectric constant type Q or D.F. 30pFmin. : Q 350 0.2 max. Perform a heat treatment at 150+0/-10 for 1hour and then sit 10pF and over, 30pF and below:Q275+5C/2 for 24+/-2 hours at room temperature. Perform the initial measurement. 10pFmax.: Q 200+10C C: Nominal Capacitance(pF) Insulation More than 10000M or 500F More than 500M or 25F Resistance (Whichever is smaller) (Whichever is smaller) 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Perform cycles test according to the four heat treatments specifications in the following table. in the following table. Appearance No marking defects Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-2.5% or +/-0.25pF Within +/-10.0% Cycles Change (Whichever is larger) Step Time(min) 1000 5 Q or D.F. 30pFmin. : Q1000 0.2 max. 1 15+/-3 -40+0/-3 -55+0/-3 30pFmax.: Q 400+20C 2 1 Room Room C: Nominal Capacitance(pF) 3 15+/-3 105+3/-0 125+3/-0 4 1 Room Room Insulation More than 10000M or 500F More than 1000M or 50F Initial measurement for high dielectric constant type Resistance (Whichever is smaller) (Whichever is smaller) 25 Perform a heat treatment at 150+0/-10 for 1hour and then sit for 24+/-2 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Phisical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) specifications in the following table. at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12 hours. Appearance No marking defects The charge/discharge current is less than 50mA. Capacitance Within +/-3.0% or +/-0.30pF Within +/-12.5% Change (Whichever is larger) Initial measurement for high dielectric constant type Q or D.F. 30pF and over: Q200 0.2 max. Perform a heat treatment at 150+0/-10 for 1hour and then sit 30pF and below: Q100+10C/3 for 24+/-2 hours at room temperature. Perform the initial measurement. C: Nominal Capacitance(pF) Measurement after test for high dielectric constant type Insulation More than 1000M or 50F More than 100M or 5F Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance (Whichever is smaller) (Whichever is smaller) for 24+/-2 hours at room temperature. Perform the initial measurement. 25 JEMCGS-07208 2