X-On Electronics has gained recognition as a prominent supplier of GRT188R71H103KE01D Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GRT188R71H103KE01D Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GRT188R71H103KE01D Murata

GRT188R71H103KE01D electronic component of Murata
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Part No.GRT188R71H103KE01D
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Datasheet: GRT188R71H103KE01D Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.2023 ea
Line Total: USD 0.2 
Availability - 10523
Ship by Tue. 24 Dec to Thu. 26 Dec
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
10523
Ship by Tue. 24 Dec to Thu. 26 Dec
MOQ : 1
Multiples : 1
1 : USD 0.2023
10 : USD 0.1332
100 : USD 0.0671
1000 : USD 0.0437
4000 : USD 0.0404
24000 : USD 0.0309

   
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We are delighted to provide the GRT188R71H103KE01D from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GRT188R71H103KE01D and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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Chip Monolithic Ceramic Capacitor meet AEC-Q200 for Infotainment GRT188R71H103KE01 (0603, X7R:EIA, 10000pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 18 8 R7 1H 103 K E01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.60.1 0.80.1 0.80.1 0.2 to 0.5 0.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7R(EIA) (5) Nominal Methods Rated Capacitance Capacitance (Operating Temp. coeff Temp. Range Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C -15 to 15 % DC 50 V 10000 pF 10 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 4000 pcs./Reel PAPER W8P4 f330mm Reel J 10000 pcs./Reel PAPER W8P4 Product specifications in this catalog are as of Oct.11,2016,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT188R71H103KE01-01 1AEC-Q200 Murata Standard Specification and Test Methods Specifications. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Set the capacitor for 100012h at maximum operating temperature 3 . Exposure (Storage) specifications in the following table. Set for 242h at room temperature, then measure. Appearance No marking defects Capacitance Within 2.5% or 0.25pF R7: Within 12.5% Change (Whichever is larger) Q/D.F. 30pFmin. : Q 350 R7: 0.2 max. 10pF and over, 30pF and below:Q 275+5C/2 10pFmax.: Q 200+10C C: Nominal Capacitance(pF) Insulation More than 10,000M or 500 F R7: More than 500M or 25 F Resistance (Whichever is smaller) (Whichever is smaller) 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Perform cycles test according to the four heat treatments specifications in the following table. Appearance No marking defects in the following table. Set for 242h at room temperature, then measure. Capacitance Within 2.5% or 0.25pF R7: Within 10.0% Change (Whichever is larger) Cycles Step Time(min) Q/D.F. 30pFmin. : Q 1000 R7: 0.2 max. 1000 5 1 153 -40+0/-3 -55+0/-3 30pFmax.: Q 400+20C 2 1 Room Room C: Nominal Capacitance(pF) 3 153 105+3/-0 125+3/-0 4 1 Room Room Insulation More than 10,000M or 500 F R7: More than 1,000M or 50 F Initial measurement for high dielectric constant type Resistance (Whichever is smaller) (Whichever is smaller) Perform a heat treatment at 150+0/-10 for 1h and then set for 242h at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Phisical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) at 853 and 80 to 85% humidity for 100012h. Appearance No marking defects Remove and set for 242h at room temperature, then measure. Capacitance Within 3.0% or 0.30pF R7: Within 12.5% Change (Whichever is larger) The charge/discharge current is less than 50mA. Q/D.F. 30pF and over: Q 200 R7: 0.2 max Measurement after test for high dielectric constant type 30pF and below: Q 100+10C/3 Perform a heat treatment at 150+0/10C for 1h and then let C: Nominal Capacitance(pF) sit for 242h at room temperature, then measure. Insulation More than 1,000M or 50 F R7: More than 100M or 5 F Resistance (Whichever is smaller) (Whichever is smaller) JEMCGS-04199B 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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