Only Reflow Soldering Low ESL Chip Multilayer Ceramic Capacitors for Automotive LLC152D70G105ME01 (0402, X7T:EIA, 1uF, DC4V) : packaging code Reference Sheet 1.Scope This product specification is applied to Low ESL Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. This product is applied for Only Reflow Soldering. 2.MURATA Part NO. System (Ex.) LLC 15 2 D7 0G 105 M E01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 0.50.2 1.00.2 0.20.02 0.20.06 0.07 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7T(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C DC 4 V 1 uF 20 % -33 to 22 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 20000 pcs./Reel PAPER W8P2 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Oct.28,2020,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. LLC152D70G105ME01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at the maximum rated Appearance No defects or abnormalities temperature +/-3 . Capacitance Within +/-20% Set for 24+/-2h at room temperature, then measure. Change D.F. 0.2max Initial measurement Perform a heat treatment at 150+0/-10 for 1h and then sit Insulation More than 500M or 12.5 F for 24+/-2h at room temperature. Resistance Perform the initial measurement. (Whichever is smaller) 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No defects or abnormalities listed in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-7.5% Step 1 2 3 4 Change Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 ( C) Temp. Temp. D.F. Within the specified initial value. Time 30+/-3 1 30+/-3 1 (min) Initial measurement Insulation Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit Resistance for 24+/-2h at room temperature. 25 Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No defects or abnormalities The charge/discharge current is less than 50mA. Capacitance Within +/-12.5% Initial measurement Change Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. D.F. 0.2 max Perform the initial measurement. Measurement after test Perform a heat treatment at 150+0/10C for 1h and then let sit for 24+/-2h at room temperature, then measure. Insulation More than 500M or 12.5 F Resistance (Whichever is smaller) 25 JEMCFS-07484A 2