LQH31CN100K03L Murata

Spec No. JELF243A-0031S-01 P.1/8 Reference Only CHIP COILCHIP INDUCTORSLQH31CN03L REFERENCE SPECIFICATION 1.Scope This reference specification applies to LQH31CN series, Chip coil (Chip Inductors). 2.Part Numbering (ex) LQ H 31 C N R12 M 0 3 L Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging (LW) and L:Taping Characteristics 3.Rating Operating Temperature Range -40 to +85C Storage Temperature Range. -40 to +85C DC Self Resonant Rated Inductance Customer MURATA Resistance Frequency Current Part Number Part Number (H) Tolerance () (MHz min.) (mA) LQH31CNR12M03L 0.12 0.0840% 970 250 LQH31CNR22M03L0.22 0.1040% 850 LQH31CNR47M03L 0.47 0.1540% 180 700 20% LQH31CN1R0M03L1.0 0.2830% 100 510 LQH31CN2R2M03L2.2 0.4130% 50 430 LQH31CN4R7M03L4.7 0.6530% 31 340 LQH31CN100K03L 10 1.330% 20 230 LQH31CN220K03L22 3.030% 14 160 10% LQH31CN470K03L47 8.030% 10 100 LQH31CN101K03L100 12.030% 7 80 When applied Rated current to the Products, Inductance will be within 10% of initial Inductance value. When applied Rated current to the Products, temperature rise caused by self-generated heat shall be limited to 35 max. 4. Testing Conditions <Unless otherwise specified> <In case of doubt> Temperature : Ordinary Temperature (15 to 35C) Temperature : 20 2C Humidity : Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70 %(RH) Atmospheric Pressure : 86 to 106 kPa 5. Appearance and Dimensions 1.60.2 2.30.2 Unit Mass(Typical value) 0.029g 3.20.3 1.60.2 No polarity. 0.7 0.7 0.7 (in mm) min. min. min. MURATA MFG.CO., LTD 1.80.2Spec No. JELF243A-0031S-01 P.2/8 Reference Only 6.Electrical Performance No. Item Specification Test Method 6.1 Inductance Inductance shall meet item 3. Measuring Equipment : KEYSIGHT 4192A or equivalent Measuring Frequency : 1MHz Measuring Fixture : Measuring Fixture Fig.1 6.2 DC DC Resistance shall meet item 3. Measuring Equipment:Digital multi meter Resistance 6.3 Self Resonant S.R.F shall meet item 3. Measuring Equipment: Frequency(S.R.F) KEYSIGHT E4991A or equivalent 7.Mechanical Performance No. Item Specification Test Method 7.1 Shear Test Chip coil shall not be damaged after Substrate: Glass-epoxy substrate tested as test method. Chip Ciol 4.5 Pattern Solder resist Substrate 1.5 (in mm) 1 Chip Coil Applied Direction : F Substrate Force: 10N Hold Duration: 5s 1s 7.2 Bending Test Substrate: Glass-epoxy substrate (100mm40mm1.6mm) Speed of Applying Force: 1mm / s Deflection: 2mm Hold Duration: 30s Pressure jig R340 F Deflection 45 45 (in mm) Product 7.3 Vibration Oscillation Frequency: 10Hz to 55Hz to 10Hz for 1 min Total Amplitude: 1.5 mm Testing Time: A period of 2 hours in each of 3 mutually perpendicular directions. (Total 6 hours) MURATA MFG.CO., LTD