X-On Electronics has gained recognition as a prominent supplier of DEMO56F8014-EE Development Boards & Kits - Other Processors across the USA, India, Europe, Australia, and various other global locations. DEMO56F8014-EE Development Boards & Kits - Other Processors are a product manufactured by NXP. We provide cost-effective solutions for Development Boards & Kits - Other Processors, ensuring timely deliveries around the world.

DEMO56F8014-EE NXP

DEMO56F8014-EE electronic component of NXP
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Part No.DEMO56F8014-EE
Manufacturer: NXP
Category: Development Boards & Kits - Other Processors
Description: Development Boards & Kits - Other Processors MC56F8014 BD W/UNIV PS
Datasheet: DEMO56F8014-EE Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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56F8014 Data Sheet Technical Data 56F8000 16-bit Digital Signal Controllers MC56F8014 Rev. 11 05/2008 freescale.com Document Revision History Version History Description of Change Rev 0 Initial release Rev 1 Updates to Part 10, Specifications, Table 10-1, added maximum clamp current, per pin Table 10-11, clarified variation over temperature table and graph Table 10-15, added LIN slave timing Rev 2 Added alternate pins to Figure 11-1 and Table 11-1. Rev 3 Corrected bit selects in Timer Channel 3 Input (TC3 INP) bit 9, Section 6.3.1.7, clarified Section 1.4.1, and simplified notes in Table 10-9, Rev 4 Added clarification on sync inputs in Section 1.4.1, added voltage difference specification to Table 10-1 and Table 10-4, deleted formula for Ambient Operating Temperature in Table 10-4, and a note for pin group 3, corrected Table 8-1, error in Port C peripheral function configuration, updated notes in Table 10-9. Added RoHs and pb-free language to back cover. Rev 5 Updates to Section 10 Table 10-5, corrected max values for ADC Input Current High and Low corrected typ value for pull-up disabled Digital Input Current Low (a) Table 10-6, corrected typ and added max values for Standby > Stop and Powerdown modes Table 10-7, corrected min value for Low-Voltage Interrupt for 3.3V Table 10-11, corrected typ and max values and units for PLL lock time Table 10-12, corrected typ values for Relaxation Oscillator output frequency and variation over temperature (also increased temp range to 150 degreesC) and added variation over temperature from 0105 degreesC Updated Figure 10-5 Table 10-19, updated max values for Integral Non-Linearity full input signal range, Negative Differential Non-Linearity, ADC internal clock, Offset Voltage Internal Ref, Gain Error and Offset Voltage External Ref updated typ values for Negative Differential Non-Linearity, Offset Voltage Internal Ref, Gain Error and Offset Voltage External Ref added new min values and corrected typ values for Signal-to-noise ratio, Total Harmonic Distortion, Spurious Free Dynamic Range, Signal-to-noise plus distortion, Effective Number of Bits Rev 6 Added details to Section 1. Clarified language in State During Reset column in Table 2-3 corrected flash data retention temperature in Table 10-4 moved input current high/low toTable 10-19 and location of footnotes in Table 10-5 reorganized Table 10-19 clarified title of Figure 10-1. Rev. 7 In Table 10-4, added an entry for flash data retention with less than 100 program/erase cycles (minimum 20 years). In Table 10-6, changed the device clock speed in STOP mode from 8MHz to 4MHz. In Table 10-12, changed the typical relaxation oscillator output frequency in Standby mode from 400kHz to 200kHz. Rev. 8 In Table 10-19, changed the maximum ADC internal clock frequency from 8MHz to 5.33MHz. 56F8014 Technical Data, Rev. 11 2 Freescale Semiconductor

Tariff Desc

8543.70.00 Other machines and apparatus Free
13 Signal processors (graphic equalisers, crossovers etc.) 91 Other Free

9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

9031.80.00 MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free

9030.31.00 Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiations.
Other instruments and apparatus, for measuring or checking voltage, current, resistance or power Multimeters without a recording device Free

8473.30.00 Parts and accessories of the machines of 8471 AUTOMATIC DATA PROCESSING MACHINES AND UNITS THEREOF; MAGNETIC OR OPTICAL READERS, MACHINES FOR TRANSCRIBING DATA ONTO DATA MEDIA IN CODED FORM AND MACHINES FOR PROCESSING SUCH DATA, NOT ELSEWHERE SPECIFIED OR INCLUDED:
.Other 71 No Weighing less than 1kg Free

8537 BOARDS, PANELS, CONSOLES, DESKS, CABINETS AND OTHER BASES, EQUIPPED WITH TWO OR MORE APPARATUS OF 8535 OR 8536, FOR ELECTRIC CONTROL OR THE DISTRIBUTION OF ELECTRICITY, INCLUDING THOSE INCORPORATING INSTRUMENTS OR APPARATUS OF CHAPTER 90, AND NUMERICAL CONTROL APPARATUS, OTHER THAN SWITCHING APPARATUS OF 8517:
8538 PARTS SUITABLE FOR USE SOLELY OR PRINCIPALLY WITH THE APPARATUS OF 8535, 8536 OR 8537:
8538.10.10 22 For programmable controllers Free
Freescale
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NXP
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NXP (FREESCALE)
NXP / Freescale
NXP SEMI
NXP Semicon
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NXP Semiconductors
NXP USA Inc.
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