EEPROM Serial 2/4/8/16-Kb 2 I C Automotive Grade 1 in Wettable Flank UDFN-8 Package NV24C02MUW, www.onsemi.com NV24C04MUW, NV24C08MUW, NV24C16MUW 1 UDFN8 Description MUW3 SUFFIX 2 The NV24C02/04/08/16 are EEPROM Serial 2/4/8/16Kb I C CASE 517DH Automotive Grade 1 devices organized internally as 16/32/64 and 128 pages respectively of 16 bytes each. All devices support the Standard 2 (100 kHz) and Fast (400 kHz) I C protocol. MARKING DIAGRAM Data is written by providing a starting address, then loading 1 to 16 1 XXXXX contiguous bytes into a Page Write Buffer, and then writing all data to AWLYW nonvolatile memory in one internal write cycle. Data is read by providing a starting address and then shifting out data serially while XXXXX = Specific Device Code automatically incrementing the internal address count. A = Assembly Location External address pins make it possible to address up to eight WL = Wafer Lot NV24C02, four NV24C04, two NV24C08 and one NV24C16 device Y = Year W = Work Week on the same bus. = PbFree Package Features Automotive AECQ100 Grade 1 (40C to +125C) Qualified 2 ORDERING INFORMATION Supports Standard, Fast and FastPlus I C Protocol See detailed ordering, marking and shipping information on 2.5 V to 5.5 V Supply Voltage Range page 9 of this data sheet. 16Byte Page Write Buffer Fast Write Time (4 ms max) Hardware Write Protection for Entire Memory 2 Schmitt Triggers and Noise Suppression Filters on I C Bus Inputs (SCL and SDA) Low power CMOS Technology More than 1,000,000 Program/Erase Cycles 100 Year Data Retention UDFN8 (2 x 3 mm) Wettable Flank Package (40C to +125C) These Devices are PbFree, Halogen Free/BFR Free and are RoHS Compliant PIN CONFIGURATION NV24C 16 / 08 / 04 / 02 /// V NC NC NC A 1 CC 0 NC///NC A A WP 1 1 NC/// A A A SCL 2 2 2 V SDA SS UDFN8 (Top View) Semiconductor Components Industries, LLC, 2017 1 Publication Order Number: July, 2020 Rev. 5 NV24C02MUW/DNV24C02MUW, NV24C04MUW, NV24C08MUW, NV24C16MUW V CC Table 1. PIN FUNCTION Pin Name Function A0, A1, A2 Device Address Input SCL SDA Serial Data Input/Output SCL Serial Clock Input A , A , A NV24Cxx SDA 2 1 0 WP Write Protect Input WP V Power Supply CC V Ground SS NC No Connect V SS Figure 1. Functional Symbol Table 2. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Unit Storage Temperature 65 to +150 C Voltage on any pin with respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. During input transitions, voltage undershoot on any pin should not exceed 1 V for more than 20 ns. Voltage overshoot on pins A , A , A 0 1 2 2 and WP should not exceed V + 1 V for more than 20 ns, while voltage on the I C bus pins, SCL and SDA, should not exceed the absolute CC maximum ratings, irrespective of V . CC Table 3. RELIABILITY CHARACTERISTICS Symbol Parameter Min Unit N (Note 2) Endurance 1,000,000 Write Cycles (Note 3) END T (Note 2) Data Retention 100 Years DR 2. T = 25C A 3. A Write Cycle refers to writing a Byte or a Page. Table 4. DC OPERATING CHARACTERISTICS (V = 2.5 V to 5.5 V, T = 40C to +125C, unless otherwise specied.) CC A Symbol Parameter Test Conditions Min Max Unit I Read Current Read 0.3 mA CCR 2 mA I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage 0.5 0.3 V V IL1 CC V Input High Voltage 0.7 V V + 0.5 V IH1 CC CC V Output Low Voltage I = 6.0 mA 0.4 V OL1 OL Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. www.onsemi.com 2