TIS98 (Texture Inspection System 98) is a part of a semiconductor inspection system that enables precise quality control of semiconductor wafers after they have been manufactured. It is commonly found used in the inspection of various components found in LED chips, LCD displays, image sensors, camera modules, and power ICs. The system consists of several subsystems, which include a digital optical microscopy unit, an automated layout measurement unit, a software/controller, and a dedicated image processing software. The system is designed to perform analysis and precise measurements of textiles manufactured from thin-film materials, such as metal layers, photosensitive resin layers, and insulating dielectric layers. The analysis and measurement technology used by TIS98 is X-ray fluorescence (XRF) technology. Through this technology, it is possible to resolve even minute textures and defects, providing a highly precise 3D image of the surface of the product.