The documentation and process conversion measures INCH-POUND necessary to comply with this document shall be MIL-PRF-19500/551H completed by 4 March 2018. 4 December 2017 SUPERSEDING MIL-PRF-19500/551G 23 May 2014 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, SILICON, TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N6461 THROUGH 1N6468, 1N6461US THROUGH 1N6468US, AND 1N6461URS THROUGH 1N6468URS, JAN, JANTX, AND JANTXV This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product described herein shall consist of this specification sheet and MIL-PRF-19500. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for 500-watt peak pulse, power, silicon, transient voltage suppressor diodes. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500. 1.2 Physical dimensions. See figures 1, 2, and 3. 1.3 Maximum ratings. Maximum ratings are as shown in columns 4, 6, and 7 of the electrical characteristics table herein and as follows: a. P = 2.5 W (T = room ambient as defined in the general requirements of 4.5 of MIL-STD-750). R A Derate at 16.7 mW/C for leaded devices and 50 mW/C for surface mount devices (see figure 4). b. P = 500 W (see figure 5) at t = 1 ms. PR p c. I = 80 A(pk) at t = 8.33 ms (T = +25 C). FSM p A d. -55 C T +175 C -55 C T +175 C (ambient). op STG 1.4 Primary electrical characteristics. Primary electrical characteristic columns 2 and 4 of the electrical characteristics herein. Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to Semiconductor dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at MIL-PRF-19500/551H * 1.5 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-19500, and as specified herein. See 6.4 for PIN construction example and 6.5 for a list of available PINs. * 1.5.1 JAN certification mark and quality level for encapsulated devices. The quality level designators for encapsulated devices that are applicable for this specification sheet from the lowest to the highest level are as follows: JAN, JANTX, andJANTX. * 1.5.2 Device type. The designation system for the device types of semiconductor covered by this specification sheet are as follows. * 1.5.2.1 First number and first letter symbols. The semiconductors of this specification sheet use the first number and letter symbols1. * 1.5.2.2 Second number symbols. The second number symbols for the semiconductor covered by this specification sheet are as follows: 6461 ,6462 6463 ,6464 6465 ,6466 ,6466 , and 6468. * 1.5.3 Suffix symbols. The following suffix symbols are incorporated in the PIN for this specification sheet: No second suffix Indicates a through hole mount, axial package. (see figure 1) US Indicates a surface mount, square endcap package. (see figure 2) URS Indicates a surface mount, 1 round endcap and 1 square endcap package. (see figure 3) * 1.5.4 Lead finish. The lead finishes applicable to this specification sheet are listed on QML-19500. 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-19500 - Semiconductor Devices, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-750 - Test Methods for Semiconductor Devices. (Copies of these documents are available online at