X-On Electronics has gained recognition as a prominent supplier of 4431-T-B1 D 868 Sub-GHz Development Tools across the USA, India, Europe, Australia, and various other global locations. 4431-T-B1 D 868 Sub-GHz Development Tools are a product manufactured by Silicon Labs. We provide cost-effective solutions for Sub-GHz Development Tools, ensuring timely deliveries around the world.

4431-T-B1 D 868 Silicon Labs

4431-T-B1 D 868 electronic component of Silicon Labs
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Part No.4431-T-B1 D 868
Manufacturer: Silicon Labs
Category: Sub-GHz Development Tools
Description: Sub-GHz Development Tools Single Tied Antenna 4431 Rev B1 TRx Testcard 868
Datasheet: 4431-T-B1 D 868 Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



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We are delighted to provide the 4431-T-B1 D 868 from our Sub-GHz Development Tools category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the 4431-T-B1 D 868 and other electronic components in the Sub-GHz Development Tools category and beyond.

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AN414 EZRADIOPRO LAYOUT DESIGN GUIDE 1. Introduction The purpose of this application note is to help users design EZRadioPRO PCBs using design practices that allow for good RF performance. This application note also help designers by separating TX and RX concerns. The RF performance and the critical maximum peak voltage on the output pin strongly depend on the PCB layout as well as the design of the matching networks. For optimal performance, Silicon Labs recommends the use of the PCB layout design hints described in the following sections. 2. Design Recommendations when Using EZRadioPRO RF ICs Extensive testing has been completed using reference designs provided by Silicon Labs. It is recommended to designers to use the reference designs as-is since they minimize detuning effects caused by parasitics, component placement, and PCB routing. When layouts cannot be followed as shown by the reference designs (due to PCB size and shape limitations), the following layout design rules are recommended. 2.1. Guidelines for Layout Design when Using the Si4430/31 The Si4430/31 devices use a Class-E type TX matching network with a typical output power level of +13 dBm at VDD = 3.3 V. Two basic types of board layout configurations exist at all frequency bands: the Split TX/RX type and the Direct Tie type. In the Split TX/RX type, the TX and RX paths are separated, and individual SMA connectors are provided for each path. In the Direct Tie type, the TX and RX paths are connected together directly, without any additional RF switch. The operating principle of both types and the reference designs with element values are given in AN436: Si4030/4031/4430/4431 PA Matching for wirewound and multilayer type 0402 size SMD inductances as well. The Split and Direct Tie type boards have slightly different PCB layouts, which are described in separate sections. 2.1.1. Split Type Matching Network Layout Based upon the 4431-T-B1 B Test Card (Separate TX and RX Paths with Two Antennas) Examples shown in this section of the guide are based upon the layout of the 4431-T-B1 B test cards. These cards contain two separate antennas for the TX and RX paths. This type of test card is best suited for demonstrating the output power and sensitivity of the EZRadioPRO RFICs. For this purpose, the TX and RX path layouts are separated and isolated as much as possible to minimize the mutual coupling effects. This type of test card is recommended for laboratory evaluation and not for range tests because the presence of two closely-spaced antennas may cause shadowing when receiving a radiated signal. The main layout design concepts are reviewed through this layout to demonstrate the basic principles. However, for an actual application, the layouts of the test cards with a single antenna (or with antenna diversity) should be used as references. The schematic of the Split type matching network for Si4431 RevB1 is shown in Figure 1. Rev. 0.2 12/10 Copyright 2010 by Silicon Laboratories AN414AN414 Figure 1. Schematic of the Split Type Matching Network for the Si4431 RevB1 The layout structure of the Split type matching network is shown in Figure 2. 2 Rev. 0.2

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8543.70.00 Other machines and apparatus Free
13 Signal processors (graphic equalisers, crossovers etc.) 91 Other Free

9027.10.00 Instruments and apparatus for physical or chemical analysis (eg, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes Free

9031.80.00 MEASURING OR CHECKING INSTRUMENTS, APPLIANCES AND MACHINES, NOT SPECIFIED OR INCLUDED ELSEWHERE IN THIS CHAPTER; PROFILE PROJECTORS Other instruments, appliances and machines Free

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8538 PARTS SUITABLE FOR USE SOLELY OR PRINCIPALLY WITH THE APPARATUS OF 8535, 8536 OR 8537:
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