108-2426 Design Rev O5 Objectives CXP Connector System DESIGN OBJECTIVES The product described in this document has not been fully tested to ensure conformance to the requirements outlined below. Therefore, TE Connectivity (TE) makes no representation or warranty, express or implied, that the product will comply with these requirements. Further, TE may change these requirements based on the results of additional testing and evaluation. Contact TE Engineering for further details. 1. SCOPE 1.1. Content This specification covers performance, tests and quality requirements for the TE Connectivity (TE) CXP Connector System. These connectors are cable mounted plug and printed circuit board mounted receptacle connectors, designed for intra-building use only. 1.2. Qualification When tests are performed on the subject product line, procedures specified in Figure 1 shall be used. All inspections shall be performed using the applicable inspection plan and product drawing. 2. APPLICABLE DOCUMENTS The following documents form a part of this specification to the extent specified herein. Unless otherwise specified, the latest edition of the document applies. In the event of conflict between the requirements of this specification and the product drawing, the product drawing shall take precedence. In the event of conflict between the requirements of this specification and the referenced documents, this specification shall take precedence. 2.1. TE Documents 114-13283: Application Specification (CXP Connectors) 501-TBD: Qualification Test Report (CXP Connector System) 2.2. Industry Document EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications 2.3. Reference Document 109-197: Test Specification (TE Test Specifications vs EIA and IEC Test Methods) 3. REQUIREMENTS 3.1. Design and Construction Product shall be of the design, construction and physical dimensions specified on the applicable product drawing. 3.2. Materials Materials used in the construction of this product shall be as specified on the applicable product drawing. 2011 Tyco Electronics Corporation, a TE Connectivity Ltd. Company For latest revision, visit our website at www.te.com/documents. 1 of 6 All Rights Reserved For Regional Customer Service, visit our website at www.te.com Indicates Change * Trademark TE Connectivity, TE connectivity (logo), and TE (logo) are trademarks. Other logos, product and/or Company names may be trademarks of their respective owners. LOC B DESIGN OBJECTIVES 15Aug11108-2426 3.3. Ratings Voltage: 120 volts AC Current: Signal application only Temperature: -40 to 85C 3.4. Performance and Test Description Product is designed to meet the electrical, mechanical and environmental performance requirements specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental conditions. 3.5. Test Requirements and Procedures Summary Test Description Requirement Procedure Initial examination of product. Meets requirements of product EIA-364-18. drawing and Application Visual and dimensional (C of C) Specification 114-13283. inspection per product drawing. Final examination of product. Meets visual requirements. EIA-364-18. Visual inspection. ELECTRICAL Low Level Contact Resistance 80 milliohms maximum initial. EIA-364-23. (LLCR). R 20 milliohms maximum for Subject specimens to 100 signal contacts. milliamperes maximum and 20 millivolts maximum open circuit voltage. Insulation resistance. 1000 megohms minimum. EIA-364-21. 500 volts DC, 2 minute hold. Test between adjacent contacts. Withstanding voltage. One minute hold with no breakdown EIA-364-20, Condition I. or flashover. 300 volts AC at sea level. Test between adjacent contacts, signal to ground as applicable. MECHANICAL Random vibration. No discontinuities of 1 microsecond EIA-364-28, Test Condition VII, or longer duration. Condition Letter D. See Note. Subject mated specimens to 3.10 G s rms between 20 to 500 Hz. Fifteen minutes in each of 3 mutually perpendicular planes. Mechanical shock. No discontinuities of 1 microsecond EIA-364-27, Method H. or longer duration. Subject mated specimens to 30 G s See Note. half-sine shock pulses of 11 milliseconds duration. Three shocks in each direction applied along 3 mutually perpendicular planes, 18 total shocks. Figure 1 (continued) Rev O5 2 of 6 DESIGN OBJECTIVES 15Aug11