7UL1T02FU,LF Toshiba

7UL1T02FU CMOS Digital Integrated Circuits Silicon Monolithic 7UL1T02FU7UL1T02FU7UL1T02FU7UL1T02FU 1. 1. Functional DescriptionFunctional Description 1. 1. Functional DescriptionFunctional Description 2-Input NOR Gate with Level Shifting 2. 2. 2. 2. FeaturesFeaturesFeaturesFeatures (1) Operating supply voltage range: V = 2.3 V to 3.6 V CC (2) The high-level input voltage is up translation to the power supply voltage. (3) The high-level input voltage is down translation to the power supply voltage. (4) 3.6 V tolerant inputs (5) 3.6 V power-down protection is provided on output. 3. 3. PackagingPackaging 3. 3. PackagingPackaging USV 4. 4. 4. 4. Marking and Pin AssignmentMarking and Pin AssignmentMarking and Pin AssignmentMarking and Pin Assignment MarkingMarkingMarkingMarking Pin Assignment (Top view)Pin Assignment (Top view)Pin Assignment (Top view)Pin Assignment (Top view) Start of commercial production 2018-10 2018-2020 2020-01-07 1 Toshiba Electronic Devices & Storage Corporation Rev.3.07UL1T02FU 5. 5. 5. 5. IEC Logic SymbolIEC Logic SymbolIEC Logic SymbolIEC Logic Symbol 6. 6. 6. 6. Truth TableTruth TableTruth TableTruth Table A B Y L L H L H L H L L H H L 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T = 25 ) 7. 7. 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, TAbsolute Maximum Ratings (Note) (Unless otherwise specified, TAbsolute Maximum Ratings (Note) (Unless otherwise specified, T = 25 = 25 = 25 ))) aaaa Characteristics Symbol Note Rating Unit Supply voltage V -0.5 to 4.6 V CC Input voltage V -0.5 to 4.6 V IN DC output voltage V (Note 1) -0.5 to 4.6 V OUT (Note 2) -0.5 to V + 0.5 CC Input diode current I -20 mA IK Output diode current I (Note 3) -20 mA OK DC output current I 25 mA OUT V /ground current I 50 mA CC CC Power dissipation P 200 mW D Storage temperature T -65 to 150 stg Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: V = 0 V CC Note 2: High (H) or Low (L) state. I absolute maximum rating must be observed. OUT Note 3: V < GND OUT 2018-2020 2020-01-07 2 Toshiba Electronic Devices & Storage Corporation Rev.3.0