TC7WZ74FUTE12LF Toshiba

TC7WZ74FU CMOS Digital Integrated Circuits Silicon Monolithic TC7WZ74FU 1. Functional Description D-Type Flip Flop with Preset and Clear 2. Features (1) Wide operating temperature range: T = -40 to 125 (Note 1) opr (2) High output current: 24 mA (min) (V = 3.0 V) CC (3) High speed operation: t = 2.8 ns (typ.) (V = 5.0 V, C = 50 pF) pd CC L (4) Wide operating voltage range: V = 1.65 to 5.5 V CC (5) 5.5 V tolerant inputs (6) 5.5 V power down protection output (7) Matches the performance of TC74LCX series when operated at 3.3 V V CC Note 1: For devices with the ordering part number ending in J(CT. T = -40 to 85 for the other devices. opr 3. Packaging SM8 4. Marking and Pin Assignment Marking Pin Assignment (Top view) Start of commercial production 2001-04 2017-2021 2021-09-06 1 Toshiba Electronic Devices & Storage Corporation Rev.5.0TC7WZ74FU 5. IEC Logic Symbol 6. Truth Table X: Don t care 7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T = 25 ) a Characteristics Symbol Note Rating Unit Supply voltage V -0.5 to 6.0 V CC Input voltage V -0.5 to 6.0 V IN DC output voltage V (Note 1) -0.5 to 6.0 V OUT (Note 2) -0.5 to V + 0.5 CC Input diode current I -20 mA IK Output diode current I (Note 3) -20 OK DC output current I 50 OUT V /ground current I 50 mA CC CC Power dissipation P 300 mW D Storage temperature T -65 to 150 stg Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: V = 0 V CC Note 2: High (H) or Low (L) state. I absolute maximum rating must be observed. OUT Note 3: V < GND OUT 2017-2021 2021-09-06 2 Toshiba Electronic Devices & Storage Corporation Rev.5.0