MGA-633P8, MGA-634P8 and MGA-635P8 Low Noise, High Linearity Low Noise Amplifier Reliability Data Sheet Description Reliability Prediction Model This document describes the reliability performance of Failure rate predictions are based on HTOL test results. MGA-63xP8 series of devices based on a series of reliabil- The prediction uses an exponential cumulative failure ity tests conducted. function (constant failure rate) as the reliability predic- tion model to predict failure rate and mean time to failure Avago Technologies MGA-63xP8 series is an economical, (MTTF) at various temperatures as shown in Table 2. The easy-to-use GaAs MMIC Low Noise Amplifier (LNA). The wear out mechanisms is therefore not considered. The LNA has low noise and high linearity achieved through Arrhenius temperature de-rating equation is used. Avago the use of Avago Technologies proprietary 0.25m GaAs Technologies assumes no failure mechanism change Enhancement-mode pHEMT process. This MGA63xP8 between stresses and use conditions. Bias and tempera- series of devices are designed for optimum use over a ture are alterable stresses and must be considered with the different range of frequencies, i.e. 450MHz-1.5GHz for thermal resistance of the devices when determining the MGA-633P8,and 1.5GHz -2.3GHz for MGA-634P8. These stress condition. The failure rate will have a direct relation- devices are housed in a standard QFN package where ship to the life stress. Using bare PHEMT die, the process the packaging reliability performance has been tested was tested to determine activation energy of 1.8eV. reliable based on representative product in 8pin QFN Confidence intervals are based upon the chi-squared pre - 2x2X0.75mm package. diction method associated with exponential distribution. The reliability performance of MGA-634P8 was leveraged on MGA-633P8 based on same wafer fabrication process and design. Table 1. Life prediction: Demonstrated Performance Stress Test Total Units Total Device No. of Failed Test Name Condition Tested Hours Units High Temperature Operating Life T = 150C 94 94000 0 j DC Bias Table 2. Estimated for Various Channel Temperatures are as follows: Channel Point Typical Performance 90% Confidence Point Typical 90% Confidence 1 Temp. (C) MTTF hours MTTF hours Performance FIT FIT 4 4 10638.29 24521.3 150 9.40 x 10 4.07 x 10 6 5 478.33 1102.6 125 2.09 x 10 9.07 x 10 7 7 100 7.05 x 10 3.06 x 10 14.19 32.7 8 8 85 7.36 x 10 3.19 x 10 1.36 3.1 1. Point MTTF is simply the total device hours divided by the number of failures. However, in cases for which no failures are observed, the point estimate is calculated under the assumption that one unit failed.Table 3. Operation Life Tests Results Failures / Stress Conditions Duration Number tested High Temperature T =150C V = 5V, Vbias = 5V 1000 hours 0/94 j dd Operating Life (DC-HTOL) JESD22-A108 Wet High Temperature 85C/85%RH V = 5V, 1000 hours 0/81 dd Operating Life (WHTOL) Vbias = 5V (on/off for 1hour) cycle bias EIA/JESD22-A101 Table 4. Environmental Tests Results Failures / Stress Conditions Duration Number tested Wet & High Temperature Storage 85C/85%RH 500 hours 0/81 1 Thermal Cycle -55/125C, 500 cycles 0/80 15 minutes dwell, 10 minute transfer JESD22-A104 1 Thermal Shock -65C /150C, 1000 cycles 0/80 5mins dwell, 10secs transfer JESD22-A106 High Temperature Storage Life 125C 1000 hours 0/98 JESD22-A103 Low Temperature Storage Life -40C 1000 hours 0/120 JESD22-A119 Solderability (PbFree) Steamage 8hours, 245C, dip for 5sec 1x 0/75 JESD22-B102 1. Data leverage to similar QFN 2x2mm package (MGA-632P8) Table 5. Thermal Resistance Information Product Product Theta Jc MGA-633P8 V = 5V, I = 50mA (typ) 72C/W dd dd MGA-634P8 Vdd=5V, Idd=50mA (typ) 62C/W MGA-635P8 Vdd=5V, Idd=50mA (typ) 75C/W 2