PI49FCT32807 1234567890123456789012345678901212345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901 2123456789012 1234567890123456789012345678901212345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901 2123456789012 3.3V 1:10 CMOS Clock Driver Features Description Low skew: < 200ps Pericom Semiconductors PI49FCT series of logic circuits are Fast switching frequency >133 MHz produced using the Companys advanced submicron CMOS technology, achieving speeds up to 133 MHz, low-power dissipation, Fast output rise/fall time < 1.5ns and output skew less than 250ps. Low propagation delay < 2.5ns The PI49FCT32807 is a 3.3V very low-skew clock buffer that produces Low input capacitance < 6.0pF ten outputs from a single low-capacitance input. Excellent output 5V I/O Tolerant input signals to power and ground ratio minimize power and ground noise, Rail-to-Rail CMOS outputs and also improves output performance. Industrial Temperature: 40C to +85C The PI49FCT32807 integrates series damping resistors on all outputs. 3.3V 10% operation Packages available: 20-pin 300mil wide SOIC (S) 20-pin 150mil wide QSOP (Q) 20-pin 209mil wide SSOP (H) Product Pin Configuration Logic Block Diagram B0 A1 20 V CC GND 2 19 B9 B1 B0318 B8 V 417 GND B2 CC 20-Pin H,Q,S B1516 B7 GND 6 15 V B3 CC B2714 B6 V 813 GND B4 CC B3912 B5 A GND 10 11 B4 B5 B6 B7 Product Pin Description Pin Name Description B8 A Input B -B Outputs 0 9 B9 GND Ground V Power CC PS8496 08/10/00 1PI49FCT32807 3.3V 1:10 CMOS Clock Driver 1234567890123456789012345678901212345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901 2123456789012 1234567890123456789012345678901212345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901 2123456789012 Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ............................................................. 65C to +150C Note: Stresses greater than those listed under MAXIMUM Ambient Temperature with Power Applied ............................. 40C to +85C RATINGS may cause permanent damage to the Supply Voltage to Ground Potential (Inputs & V Only) ...... 0.5V to +7.0V CC device. This is a stress rating only and functional Supply Voltage to Ground Potential (Outputs & D/O Only) .... 0.5V to +7.0V operation of the device at these or any other conditions above those indicated in the operational sections of DC Input Voltage ..................................................................... 0.5V to +7.0V this specification is not implied. Exposure to absolute DC Output Current ............................................................................... 120mA maximum rating conditions for extended periods may Power Dissipation ................................................................................... 0.5W affect reliability. DC Electrical Characteristics (Over the Operating Range) (1) SnymbolDsescriptio Test Condition M.in.T.yp Msax Unit V =3V CC V Output HIGH voltage I=48mA 20. 3. OH OH V =V or V IN IH IL V =3V CC V Output LOW voltage I = 12mA 05.4 0. OL OL V V =V or V IN IH IL VI)nput HIGH voltageG0uaranteed Logic HIGH Level (Input Pins 2. 5.5 IH VI)nput LOW voltageG5uaranteed Logic LOW Level (Input Pins 0. 0.8 IL IIVnput HIGH current = 3.6V V 3.6V 1 IH CC I=N A IIVnput LOW current = 3.6V V 0V 1 IL CC I=N VCVlamp diode voltage = Min., I=18mA 20.7 V1. IK CC IN (5) IOVutput HIGH current = 3.3V, V = V or V , V = 1.5V 525 04 8 OH CC IN IH IL OUT (5) IOVutput LOW current = 3.3V, V = V or V , V = 1.5V 255 409 mA OL CC IN IH IL OUT (5) (5) I Short circuit current V = Max., V = GND 050 010 18 OS CC OUT VInput Hysteresis 150 mV H R Input Hysteresis 2m2 Oh S Notes: 1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at V = 3.3V, +25C ambient and maximum loading. CC 3. V = V 0.6V at rated current. OH CC 4. This parameter is determined by device characterization but is not production tested. 5. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. PS8496 08/10/00 2