High performance handheld scopes Buitl tough to keep up with you. New 500 MHz 20 years of ScopeMeter Test Tool Innovation 190 Series II ScopeMeter Portable OscilloscopesSee more. Fix more. ScopeMeter portable oscilloscopes take you into territory where standard bench scopes cant go: where its harsh, hazardous and dirtywithout sacrificing any capabilities. Compare waveforms and easily perform The Fluke 190 Series II ScopeMeter oscilloscopes, with timing and amplitude measurements of electrically isolated channels, are safety rated for indus- 4 channels simultaneously. trial applications. These scopes combine rugged portability with the high performance of bench oscilloscopes to take you from troubleshooting microelectronics all the way into power electronic applicationsfrom dc to 500 MHz. Choose from two or four channel models with a wide range of bandwidth options. Fast sampling rates up to 5.0GS/s, 200 ps resolution and deep memory of 10,000 samples per channel allow high-accuracy capture and dis- play of waveform details, noise, and other disturbances. Perform timing or amplitude related measurements on three phases or three-axis control systems, or simply compare and contrast multiple test points in a circuit under 500 MHz bandwidth and 5GS/s sampling test. Features like TrendPlot , ScopeRecord , and Connect- can reveal signal noise and distortion that otherwise may go undetected. and-View help you quickly diagnose industrial machinery, automation and process controls, and power electronics to minimize repair costs and downtime. These features make the oscilloscopes easy to use especially when diagnosing the most difficult problems like complex waveforms, induced noise, intermittent events and signal fluctuations or drift. New Li-Ion battery technology keeps your scope on the job, all day. Fluke 190 Series II ScopeMeter test tools are available with two or four channels, 60MHz to 500 MHz. Choose the model thats right for your application and budget. 5GS/s sampling or 200 ps sample resolution provides the detail needed to inspect signal edge dV/dt or signs of destructive 22 reflections.