X-On Electronics has gained recognition as a prominent supplier of 04025D104MAT2A Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. 04025D104MAT2A Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Kyocera AVX. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

04025D104MAT2A Kyocera AVX

04025D104MAT2A electronic component of Kyocera AVX
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Part No.04025D104MAT2A
Manufacturer: Kyocera AVX
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Cap Ceramic 0.1uF 50V X5R 20% SMD 0402 85°C Paper T/R
Datasheet: 04025D104MAT2A Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
10000: USD 0.0074 ea
Line Total: USD 74 
Availability - 0
MOQ: 10000  Multiples: 10000
Pack Size: 10000
Availability Price Quantity
0
Ship by Thu. 28 Nov to Wed. 04 Dec
MOQ : 10000
Multiples : 10000
10000 : USD 0.0074

   
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We are delighted to provide the 04025D104MAT2A from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the 04025D104MAT2A and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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X5R Dielectric General Specifications GENERAL DESCRIPTION General Purpose Dielectric for Ceramic Capacitors EIA Class II Dielectric Temperature variation of capacitance is within 15% from -55C to +85C Well suited for decoupling and filtering applications Available in High Capacitance values (up to 100F) PART NUMBER (see page 2 for complete part number explanation) 1210 4 D 107 M A T 2 A Size Voltage Dielectric Capacitance Failure Packaging Capacitance Special Terminations (L x W) Tolerance Rate 4 = 4V D = X5R 2 = 7 Reel Code Code (In pF) T = Plated Ni 0101** K = 10% A = N/A 6 = 6.3V 4 = 13 Reel A = Std. 2 Sig. Digits and Sn 0201 M = 20% U = 4mm TR Z = 10V + Number of 0402 ( 010 0 5) Y = 16V Zeros 0603 3 = 25V 0805 D = 35V 1206 5 = 50V 1210 1 = 100V 1812 **EIA 01005 NOTE: Contact factory for availability of Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. TYPICAL ELECTRICAL CHARACTERISTICS Temperature Coefficient Insulation Resistance vs Temperature 10,000 20 15 10 5 1,000 0 -5 -10 100 -15 -20 0 -60 -40 -20 0 +20 +40 +60 +80 20 40 60 80 100 120 Temperature C Temperature C 2626 042418 % Capacitance Insulation Resistance (Ohm-Farads) X5R Dielectric C0G (NP0) Dielectric Specicfi ations and Test Methods Specifications and Test Methods Parameter/Test X5R Specification Limits Measuring Conditions Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55C to +85C Temperature Cycle Chamber Operating Temperature Range -55C to +125C Temperature Cycle Chamber Capacitance Within specified tolerance Capacitance Within specified tolerance Freq.: 1.0 MHz 10% for cap 1000 pF Freq.: 1.0 kHz 10% 2.5% for 50V DC rating <30 pF: Q 400+20 x Cap Value 1.0 kHz 10% for cap > 1000 pF Voltage: 1.0Vrms .2V Q 12.5% for 25V, 35V DC rating Dissipation Factor 30 pF: Q 1000 Voltage: 1.0Vrms .2V For Cap > 10 F, 0.5Vrms 120Hz 12.5% Max. for 16V DC rating and lower 100,000M or 1000M - F, Charge device with rated voltage for Contact Factory for DF by PN Insulation Resistance whichever is less 60 5 secs room temp/humidity 10,000M or 500M - F, Charge device with rated voltage for Insulation Resistance Charge device with 250% of rated voltage for whichever is less 120 5 secs room temp/humidity Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current Charge device with 250% of rated voltage for limited to 50 mA (max) Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current Note: Charge device with 150% of rated limited to 50 mA (max) voltage for 500V devices. AppearanceAppearance No defectsNo defects Deflection: 2mmDeflection: 2mm Capacitance Test TTest ime: Time: 30 seconds30 seconds Capacitance 12% 5% or .5 pF, whichever is greater Resistance to Resistance to Variation Variation Flexure Flexure Dissipation Q Meets Initial VMeets Initial Values (As alues (As Above)Above) Stresses Stresses Factor Insulation Insulation Initial Value x 0.3 Initial Value x 0.3 Resistance Resistance 95% of each terminal should be covered Dip device in eutectic solder at 230 5C Solderability 95% of each terminal should be covered Dip device in eutectic solder at 230 5C Solderability with fresh solder for 5.0 0.5 seconds with fresh solder for 5.0 0.5 seconds Appearance No defects, <25% leaching of either end terminal Appearance No defects, <25% leaching of either end terminal Capacitance 2.5% or .25 pF, whichever is greater Capacitance Variation 7.5% Dip device in eutectic solder at 260C for 60 Variation Dip device in eutectic solder at 260C for 60sec- Resistance to seconds. Store at room temperature for 24 2 Q Meets Initial Values (As Above) Dissipation Resistance to onds. Store at room temperature for 24 2hours Meets Initial Values (As Above) Solder Heat hours before measuring electrical properties. FactorInsulation Solder Heat before measuring electrical properties. Meets Initial Values (As Above) Resistance Insulation Meets Initial Values (As Above) Dielectric Resistance Meets Initial Values (As Above) Strength Dielectric Meets Initial Values (As Above) Appearance No visual defects Step 1: -55C 2 30 3 minutes Strength Capacitance 2.5% or .25 pF, whichever is greater Step 2: Room Temp 3 minutes Appearance No visual defects Step 1: -55C 2 30 3 minutes Variation Capacitance 7.5% Step 2: Room Temp 3 minutes Thermal Q Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Variation Shock Dissipation Thermal Insulation Meets Initial Values (As Above) Step 3: +85C 2 30 3 minutes Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Factor Shock Resistance Insulation Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Meets Initial Values (As Above) Resistance Strength 24 hours at room temperature Appearance No visual defects Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Capacitance Strength 24 2 hours at room temperature 3.0% or .3 pF, whichever is greater Variation Charge device with twice rated voltage in Appearance No visual defects Charge device with 1.5X rated voltage in 30 pF: Q 350 test chamber set at 125C 2C test chamber set at 85C 2C for 1000 hours CapacitanceQ 12.5% Load Life 10 pF, <30 pF: Q 275 +5C/2 for 1000 hours (+48, -0). (+48, -0). Variation (C=Nominal Cap) <10 pF: Q 200 +10C Dissipation Note: Contact factory for *optional Initial Value x 2.0 (See Above) Insulation Remove from test chamber and stabilize at Load Life Factor Initial Value x 0.3 (See Above) specification part numbers that are tested at Resistance room temperature for 24 hours Insulation < 1.5X rated voltage. Dielectric before measuring. Initial Value x 0.3 (See Above) Meets Initial Values (As Above) Resistance Strength Remove from test chamber and stabilize at room Appearance No visual defects Dielectric Meets Initial Values (As Above) temperature for 24 2 hours Capacitance Strength 5.0% or .5 pF, whichever is greater Variation Store in a test chamber set at 85C 2C/ Appearance No visual defects 30 pF: Q 350 85% 5% relative humidity for 1000 hours Store in a test chamber set at 85C 2C/ Capacitance 12.5% Load Q 10 pF, <30 pF: Q 275 +5C/2 (+48, -0) with rated voltage applied. 85% 5% relative humidity for 1000 hours Variation Humidity <10 pF: Q 200 +10C (+48, -0) with rated voltage applied. Load Dissipation Insulation Remove from chamber and stabilize at Initial Value x 2.0 (See Above) Humidity Initial Value x 0.3 (See Above) Factor Resistance room temperature for 24 2 hours Remove from chamber and stabilize at room InsulationDielectric before measuring. Initial Value x 0.3 (See Above) temperature and humidity for Meets Initial Values (As Above) Resistance Strength 24 2 hours before measuring. Dielectric Meets Initial Values (As Above) Strength 2727 042418 100917 5

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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