X7R Dielectric General Specifications X7R formulations are called temperature stable ceramics and fall into EIA Class II materials. X7R is the most popular of these intermediate dielectric constant materials. Its temperature variation of capacitance is within 15% from -55C to +125C. This capacitance change is non-linear. Capacitance for X7R varies under the influence of electrical operating con-ditions such as voltage and frequency. X7R dielectric chip usage covers the broad spectrum of industrial applications where known changes in capacitance due to applied voltages are acceptable. PART NUMBER (see page 2 for complete part number explanation) 0805 5 C 103 M A T 2 A Size Voltage Dielectric Capacitance Capacitance Failure Terminations Packaging Special X7R = C Code (In pF) Rate T = Plated Ni and Sn 2 = 7 Reel Code (L x W) 4V = 4 Tolerance 2 Sig. Digits + A = Not 7 = Gold Plated* 4 = 13 Reel A = Std. 6.3V = 6 J = 5%* Number of Zeros Applicable Z= FLEXITERM** Product 10V = Z K = 10% Contact 16V = Y M = 20% *Optional termination Factory For 25V = 3 Multiples **See FLEXITERM 50V = 5 *1F only, X7R section 100V = 1 contact factory for 200V = 2 additional values 500V = 7 NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. 042718 1919X7R Dielectric C0G (NP0) Dielectric Specicfi ations and Test Methods Specifications and Test Methods Parameter/Test X7R Specification Limits Measuring Conditions Operating Temperature Range -55C to +125C Temperature Cycle Chamber Parameter/TCapacitance est NP0 Specification LimitsWithin specified tolerance Measuring Conditions Freq.: 1.0 kHz 10% Operating Temperature Range -55C to +125C Temperature Cycle Chamber 10% for 50V DC rating 12.5% for 25V DC rating Voltage: 1.0Vrms .2V Capacitance Within specified tolerance Freq.: 1.0 MHz 10% for cap 1000 pF Dissipation Factor 12.5% for 25V and 16V DC rating For Cap > 10F, 05Vrm 120Hz <30 pF: Q 400+20 x Cap Value 1.0 kHz 10% for cap > 1000 pF 12.5% for 10V DC rating Q 30 pF: Q 1000 Voltage: 1.0Vrms .2V 100,000M or 1000M - F, Charge device with rated voltage for 100,000M or 1000M - F, Charge device with rated voltage for Insulation Resistance Insulation Resistance whichever is less 120 5 secs room temp/humidity whichever is less 60 5 secs room temp/humidity Charge device with 250% of rated voltage for Charge device with 250% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 mA (max) limited to 50 mA (max) Note: Charge device with 150% of rated Note: Charge device with 150% of rated voltage for 500V devices. voltage for 500V devices. Appearance No defects Deflection: 2mm Appearance No defects Deflection: 2mm Test Time: 30 seconds Capacitance Capacitance 12% Test Time: 30 seconds 5% or .5 pF, whichever is greater Resistance to Variation Resistance to Variation Flexure Flexure Dissipation Meets Initial Values (As Above) Stresses Q Meets Initial Values (As Above) Stresses Factor InsulationInsulation Initial Value x 0.3 Initial Value x 0.3 ResistanceResistance 95% of each terminal should be covered Dip device in eutectic solder at 230 5C 95% of each terminal should be covered Dip device in eutectic solder at 230 5C Solderability Solderability with fresh solderwith fresh solder for 5.0 0.5 secondsfor 5.0 0.5 seconds Appearance No defects, <25% leaching of either end terminal Appearance No defects, <25% leaching of either end terminal Capacitance Capacitance 2.5% or .25 pF 7.5%, whichever is greater Variation Variation Dip device in eutectic solder at 260C for 60seconds. Dip device in eutectic solder at 260C for 60 Dissipation Resistance to seconds. Store at room temperature for 24 2 Resistance to Q Meets Initial Values (As Above) Store at room temperature for 24 2hours before Meets Initial Values (As Above) Factor Solder Heat hours before measuring electrical properties. Solder Heat measuring electrical properties. Insulation Insulation Meets Initial Values (As Above) Meets Initial Values (As Above) Resistance Resistance Dielectric Dielectric Meets Initial Values (As Above) Meets Initial Values (As Above) Strength Strength Appearance No visual defects Step 1: -55C 2 30 3 minutes Appearance No visual defects Step 1: -55C 2 30 3 minutes Capacitance 2.5% or .25 pF, whichever is greater Step 2: Room Temp 3 minutes Capacitance 7.5% Step 2: Room Temp 3 minutes Variation Variation Thermal Q Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Dissipation Thermal Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Shock Factor Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Insulation Resistance Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Resistance Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Dielectric Repeat for 5 cycles and measure after Strength 24 hours at room temperature Meets Initial Values (As Above) Strength 24 2 hours at room temperature Appearance No visual defects Appearance No visual defects Capacitance 3.0% or .3 pF, whichever is greater Charge device with 1.5 rated voltage ( 10V) in Variation Charge device with twice rated voltage in Capacitance 12.5% test chamber set at 125C 2C for 1000 hours 30 pF: Q 350 test chamber set at 125C 2C Variation (+48, -0) Q Load Life 10 pF, <30 pF: Q 275 +5C/2 for 1000 hours (+48, -0). Dissipation (C=Nominal Cap) Initial Value x 2.0 (See Above) If RV > 10V then Life Test voltage will be 2xRV <10 pF: Q 200 +10C Load Life Factor but there are exceptions (please contact AVX for Insulation Remove from test chamber and stabilize at Insulation Initial V Initial Value x 0.3 (See alue x 0.3 (See Above)Above) further details on exceptions) Resistance room temperature for 24 hours Resistance Dielectric before measuring. Remove from test chamber and stabilize at room Dielectric Meets Initial Values (As Above) Meets Initial Values (As Above) Strength temperature for 24 2 hours before measuring. Strength Appearance No visual defects Appearance No visual defects Capacitance Store in a test chamber set at 85C 2C/ 5.0% or .5 pF, whichever is greater CapacitanceVariation Store in a test chamber set at 85C 2C/ 12.5% 85% 5% relative humidity for 1000 hours Variation 30 pF: Q 350 85% 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Load Load DissipationQ 10 pF, <30 pF: Q 275 +5C/2 (+48, -0) with rated voltage applied. Initial Value x 2.0 (See Above) Humidity Humidity Factor <10 pF: Q 200 +10C Remove from chamber and stabilize at room Insulation Remove from chamber and stabilize at Insulation Initial Value x 0.3 (See Above) temperature and humidity for Initial Value x 0.3 (See Above) Resistance room temperature for 24 2 hours Resistance 24 2 hours before measuring. Dielectric before measuring. Dielectric Meets Initial VMeets Initial Values (As alues (As Above)Above) Strength Strength 2020 042718 100917 5