06035AV79FAT2A Kyocera AVX

C0G (NP0) Dielectric General Specifications C0G (NP0) is the most popular formulation of the temperature-compensating, EIA Class I ceramic materials. Modern C0G (NP0) formulations contain neodymium, samarium and other rare earth oxides. C0G (NP0) ceramics offer one of the most stable capacitor dielectrics available. Capacitance change with temperature is 0 30ppm/C which is less than 0.3% C from -55C to +125C. Capacitance drift or hysteresis for C0G (NP0) ceramics is negligible at less than 0.05% versus up to 2% for films. Typical capacitance change with life is less than 0.1% for C0G (NP0), one-fifth that shown by most other dielectrics. C0G (NP0) formulations show no aging characteristics. PART NUMBER (see page 4 for complete part number explanation) 0805 5 A 101 J A T 2 A Size Voltage Dielectric Capacitance Capacitance Failure Terminations Packaging Special 6.3V = 6 (L x W) C0G (NP0) = A Code (In pF) Tolerance Rate T = Plated Ni 2 = 7 Reel Code 10V = Z 2 Sig. Digits + B = .10 pF (<10pF) A = Not and Sn 4 = 13 Reel A = Std. 16V = Y Number of Zeros C = .25 pF (<10pF) Applicable U = 4mm TR Product Contact 25V = 3 D = .50 pF (<10pF) (01005) Factory For 50V = 5 F = 1% ( 10 pF) 1 = Pd/Ag Term 100V = 1 G = 2% ( 10 pF) 200V = 2 7 = Gold Plated J = 5% 250V = V Contact Factory NOT RoHS 500V = 7 K = 10% For Multiples COMPLIANT NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. The Important Information/Disclaimer is incorporated in these specifications by reference and should be reviewed in full before placing any order. 3 022620C0G (NP0) Dielectric Specifications and Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55C to +125C Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 MHz 10% for cap 1000 pF <30 pF: Q 400+20 x Cap Value 1.0 kHz 10% for cap > 1000 pF Q 30 pF: Q 1000 Voltage: 1.0Vrms .2V 100,000M or 1000M - F, Charge device with rated voltage for 60 5 secs Insulation Resistance whichever is less room temp/humidity Charge device with 250% of rated voltage for 1-5 seconds, w/charge and discharge current limited Dielectric Strength No breakdown or visual defects to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds 5% or .5 pF, whichever is greater Variation Resistance to Flexure Q Meets Initial Values (As Above) Stresses Insulation Initial Value x 0.3 Resistance 95% of each terminal should be covered Dip device in eutectic solder at 230 5C for 5.0 Solderability with fresh solder 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance 2.5% or .25 pF, whichever is greater Variation Dip device in eutectic solder at 260C for Resistance to 60sec- onds. Store at room temperature Q Meets Initial Values (As Above) Solder Heat for 24 2hours before measuring electrical Insulation properties. Meets Initial Values (As Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Step 1: -55C 2 30 3 minutes Capacitance 2.5% or .25 pF, whichever is greater Step 2: Room Temp 3 minutes Variation Q Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Thermal Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Resistance Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Strength 24 hours at room temperature Appearance No visual defects Capacitance 3.0% or .3 pF, whichever is greater Charge device with twice rated voltage in test Variation chamber set at 125C 2C 30 pF: Q 350 for 1000 hours (+48, -0). Q 10 pF, <30 pF: Q 275 +5C/2 (C=Nominal Cap) Load Life <10 pF: Q 200 +10C Remove from test chamber and stabilize at Insulation room temperature for 24 hours Initial Value x 0.3 (See Above) Resistance before measuring. Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Capacitance 5.0% or .5 pF, whichever is greater Variation Store in a test chamber set at 85C 2C/ 85% 5% relative humidity for 1000 hours 30 pF: Q 350 (+48, -0) with rated voltage applied. Q 10 pF, <30 pF: Q 275 +5C/2 Load <10 pF: Q 200 +10C Humidity Remove from chamber and stabilize at room Insulation temperature for 24 2 hours before measuring. Resistance Initial Value x 0.3 (See Above) Dielectric Meets Initial Values (As Above) Strength The Important Information/Disclaimer is incorporated in these specifications by reference and should be reviewed in full before placing any order. 4 051818