MLCC Medical Applications MM Series General Specifications The AVX MM series is a multi-layer ceramic capacitor designed for use in medical applications other than implantable/life support. These components have the design & change control expected for medical devices and also offer enhanced LAT including reliability testing and 100% inspection. APPLICATIONS Implantable, Non-Life Supporting Medical Devices e.g. implanted temporary cardiac monitor, insulin pumps External, Life Supporting Medical Devices e.g. heart pump external controller External Devices e.g. patient monitoring, diagnostic equipment HOW TO ORDER MM02 Z A 100 J G T 3 A Capacitance Size Rated Dielectric Capacitance Failure Rate Termination Packaging Special Tolerance C = Standard 2 = 7 Reel Code MM02 = 0402 Voltage Code Code (In pF) Finish Range 4 = 13 Reel A = Standard B = 0.1pF MM03 = 0603 Z = 10V A = NP0 (C0G) (2 significant T = Plated Ni & Sn C = 0.25pF MM05 = 0805 Y = 16V C = X7R digits + number (NP0 only) Contact AVX Contact AVX for others D = 0.5pF MM06 = 1206 3 = 25V of zeros) Z = Flexiterm for others F = 1% (10pF) MM10 = 1210 5 = 50V for values <10pF: (X7R only) G = 2% (10pF) MM08 = 1808 1 = 100V letter R denotes J = 5% MM12 = 1812 2 = 200V decimal point. K = 10% MM20 = 2220 V = 250V Example: M = 20% 7 = 500V 68pF = 680 8.2pF = 8R2 COMMERCIAL VS MM SERIES PROCESS COMPARISON Commercial MM Series Standard part numbers no restriction on Specific series part number, used to control supply Administrative who purchases these parts of product Minimum ceramic thickness of 0.020 on all Design Minimum ceramic thickness of 0.022 (0.56mm) X7R product Side & end margins = 0.004 min Dicing Side & end margins = 0.003 min Cover layers = 0.003 min Lot Qualication Destructive fi As per EIA RS469 Increased sample plan stricter criteria Physical Analysis (DPA) Visual/Cosmetic Quality Standard process and inspection 100% inspection Standard sampling for accelerated wave Increased sampling for accelerated wave solder on Application Robustness solder on X7R dielectrics X7R and NP0 followed by lot by lot reliability testing AVX will qualify and notify customers before making any change to the following materials or processes: Required to inform customer of changes in: Dielectric formulation, type, or supplier form Design/Change Control Metal formulation, type, or supplier fit Termination material formulation, type, or supplier function Manufacturing equipment type Quality testing regime including sample size and accept/ reject criteria The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order. 114 040721MM Series MLCC for Medical Applications NP0 (C0G) Specifications & Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55C to +125C Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 MHz 10% for cap 1000 pF 1.0 kHz 10% for cap > 1000 pF <30 pF: Q 400+20 x Cap Value Q Voltage: 1.0Vrms .2V 30 pF: Q 1000 100,000M or 1000M - F, Charge device with rated voltage for Insulation Resistance whichever is less 60 5 secs room temp/humidity Charge device with 300% of rated voltage for 1-5 seconds, w/charge and discharge current Dielectric Strength No breakdown or visual defects limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds 5% or .5 pF, whichever is greater Variation Resistance to Flexure Q Meets Initial Values (As Above) Stresses Insulation Initial Value x 0.3 Resistance 95% of each terminal should be covered Dip device in eutectic solder at 230 5C Solderability with fresh solder for 5.0 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance 2.5% or .25 pF, whichever is greater Variation Dip device in eutectic solder at 260C for 60 Q Meets Initial Values (As Above) Resistance to seconds. Store at room temperature for 24 2 Solder Heat hours before measuring electrical properties. Insulation Meets Initial Values (As Above) Resistance Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Step 1: -55C 2 30 3 minutes Capacitance 2.5% or .25 pF, whichever is greater Step 2: Room Temp 3 minutes Variation Q Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Thermal Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Resistance Dielectric Repeat for 5 cycles and measure after Meets Initial Values (As Above) Strength 24 hours at room temperature Appearance No visual defects Capacitance 3.0% or .3 pF, whichever is greater Charge device with twice rated voltage in test Variation chamber set at 125C 2C 30 pF: Q 350 for 1000 hours (+48, -0). Q 10 pF, <30 pF: Q 275 +5C/2 Load Life <10 pF: Q 200 +10C Remove from test chamber and stabilize at Insulation Initial Value x 0.3 (See Above) room temperature for 24 hours Resistance before measuring. Dielectric Meets Initial Values (As Above) Strength Appearance No visual defects Capacitance 5.0% or .5 pF, whichever is greater Variation Store in a test chamber set at 85C 2C/ 85% 30 pF: Q 350 5% relative humidity for 1000 hours Q 10 pF, <30 pF: Q 275 +5C/2 Load (+48, -0) with rated voltage applied. <10 pF: Q 200 +10C Humidity Remove from chamber and stabilize at room Insulation Initial Value x 0.3 (See Above) temperature for 24 2 hours before measuring. Resistance Dielectric Meets Initial Values (As Above) Strength The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order. 115 113016