The documentation and process conversion INCH-POUND measures necessary to comply with this revision MIL-PRF-19500/228R shall be completed by 26 July 2013. 26 April 2013 SUPERSEDING MIL-PRF-19500/228P 26 October 2011 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, SILICON, RECTIFIER, TYPES 1N3611, 1N3612, 1N3613, 1N3614, 1N3957, JAN AND JANTX These devices are inactive for new design, preferred devices are - 1N5614, 1N5616, 1N5618, 1N5620, 1N5622 on MIL-PRF-19500/427. This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product described herein shall consist of this specification sheet and MIL-PRF-19500. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for 1.0 ampere silicon rectifier diodes. Two levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. 1.2 Physical dimensions. See figure 1, axial package. 1.3 Maximum ratings. Unless otherwise specified, T = 25C. A Types V I I Barometric T and T RWM O FSM STG J R JL pressure L = .375 inch (reduced) (9.53 mm) At: T = At: T = A A T = +55C A +55C +150C I = 1 A dc O (1) (2) (1) (2) t = 8.0 ms p V(pk) A dc mA dc A(pk) mmHg C C/W 1N3611 200 1 200 30 8 -65 to +175 36 1N3612 400 1 200 30 8 -65 to +175 36 1N3613 600 1 200 30 8 -65 to +175 36 1N3614 800 1 200 30 33 -65 to +175 36 1N3957 1,000 1 200 30 33 -65 to +175 36 (1) From I rating is independent of heat sinking, special mounting, or leads of the device. O (2) Derate linearly at 8.3 mA between T = +55C and T = +175C. A A * Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to Semiconductor dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at MIL-PRF-19500/228R 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-19500 - Semiconductor Devices, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-750 - Test Methods for Semiconductor Devices. * (Copies of these documents are available online at