Chip Monolithic Ceramic Capacitor for Automotive limited to Conductive Glue Mounting GCG32EL8EH106KA07 (1210, X8L:EIA, 10uF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor limited to Conductive Glue Mounting Type used for Automotive Electronic equipment with conductive glue mounting. 2.MURATA Part NO. System (Ex.) G CG 32 E L8 EH 106 K A07 L (1)L/W (2)T (4)Rated (3)Temperature (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.4 2.50.3 2.50.3 0.3 min. 1.0 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X8L(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) or Cap. Change (Ref.Temp.) -55 to 150 C DC 50 V * 10 uF 10 % -40 to 15 % -55 to 150 C (25 C) * When the product temperature exceeds 125C, please use this product within the voltage and temperature derated conditions in the figure below. 125 100 75 50 25 0 -75 -50 -25 0 25 50 75 100 125 150 175 Product Temperature ( ) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 1000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 4000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of Jan.23,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. G CG 32E L 8E H 106K A07-01 1 Rated Voltage (%)AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Fix the capacitor to the test substrate using a conductive glue. Exposure (Storage) specifications in the following table. (Refer to No.16.) Appearance No marking defects Set the capacitor for 100012 hours at 1503 . Set for Capacitance Within 12.5% 242 hours at room temperature, then measure. Change D.F. 0.05 max. I.R. More than 10,000M or 500 F 25 (Whichever is smaller) 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the test substrate using a conductive glue. specifications in the following table. (Refer to No.16.) Appearance No marking defects Perform the 300 cycles test according to the four heat treatments Capacitance Within 10.0% listed in the following table. Set for 242 hours at room temperature, then measure. Change D.F. W.V.: 25Vmin.: 0.03 max. Step 1 2 3 4 W.V.: 16V : 0.05 max Temp. Room Room -55+0/-3 150+3/-0 ( C) Temp. Temp. Time 15 3 1 15 3 1 (min) I.R. More than 10,000M or 500 F 25 Initial measurement (Whichever is smaller) Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Fix the capacitor to the test substrate using a conductive glue. specifications in the following table. (Refer to No.16.) Apply the 24-hour heat (25 to 65) and humidity (80 to 98%RH) treatment shown below, 10 consecutive times. Set for 242 hours at room temperature, then measure. Appearance No marking defects Humidity Humidity Capacitance Within 12.5% Temperature 8098% 80 98% Humidity Humidity Humidity Change () 9098% 9098% 9098% 70 D.F. 0.05 max. 65 60 55 50 45 40 35 30 25 I.R. More than 10,000M or 500 F +10 20 - 2 25 15 (Whichever is smaller) 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Biased Humidity Fix the capacitor to the test substrate using a conductive glue. specifications in the following table. (Refer to No.16.) Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) Appearance No marking defects at 853 and 80 to 85%RH for 100012 hours. Capacitance Within 12.5% Remove and set for 242 hours at room temperature, then measure. Change The charge/discharge current is less than 50mA. D.F. 0.05 max. I.R. More than 1,000M or 50 F 25 (Whichever is smaller) JEMCGS-05465 2