Chip Multilayer Ceramic Capacitors for Automotive GCM31CC71H475MA03 (1206, X7S:EIA, 4.7uF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 31 C C7 1H 475 M A03 L (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.2 1.60.2 1.60.2 0.3 to 0.8 1.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7S(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C -22 to 22 % DC 50 V 4.7 uF 20 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 2000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 6000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of May.30,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM31CC71H475MA03-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-10.0% Initial measurement for high dielectric constant type Change Perform a heat treatment at 150+0/-10 for 1h and then sit D.F. W.V.: 25Vmin. : 0.03 max. for 24+/-2h at room temperature.Perform the initial measurement. W.V.: 16V/10V : 0.05 max. I.R. Within the specified initial value. 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform cycle test according to the four heat treatments listed Appearance No marking defects in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-10.0% Cycles Step Time(min) Change 1000(for R7/C7) 1 15+/-3 -55+0/-3 2 1 Room D.F. W.V.: 25Vmin. : 0.03 max. 3 15+/-3 125+3/-0 W.V.: 16V/10V : 0.05 max. 4 1 Room Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for 1h and then sit I.R. Within the specified initial value. for 24+/-2h at room temperature.Perform the initial measurement. 25 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65) and humidity (80%RH to 98%RH) treatment shown below, 10 consecutive times. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-12.5% Humidity Humidity Temperature Change 8098% 8098% Humidity Humidity Humidity () 9098% 9098% 9098% 70 65 D.F. W.V.: 35Vmin.: 0.03 max. 60 W.V.: 25Vmax. : 0.05 max. 55 50 45 40 35 30 25 20 +10 - 2 15 I.R. Within the specified initial value. 10 5 Initial measuremt 25 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature.Perform the initial measurement. 6 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) specifications in the following table. at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No marking defects The charge/discharge current is less than 50mA. Remove and set for 24+/-2h at room temperature, then measure. Capacitance Within +/-12.5% Change Initial measurement for high dielectric constant type D.F. W.V.: 35Vmin.: 0.035 max. Perform a heat treatment at 150+0/-10 for 1h and then sit W.V.: 25Vmax. : 0.05 max. for 24+/-2h at room temperature.Perform the initial measurement. I.R. More than 1,000M or 50F 25 (Whichever is smaller) JEMCGS-0382L 2