GCM32DC72A475ME02L Murata

Chip Multilayer Ceramic Capacitors for Automotive GCM32DC72A475ME02 (1210, X7S:EIA, 4.7uF, DC100V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 32 D C7 2A 475 M E02 L (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.3 2.50.2 2.00.2 0.3 min. 1.0 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7S(EIA) (5) Nominal Methods Rated Capacitance (Operating Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C -22 to 22 % DC 100 V 4.7 uF 20 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 1000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 4000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of May.30,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM32DC72A475ME02-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-10% Change Initial measurement D.F. 0.2max Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Insulation Within the specified initial value. Perform the initial measurement. Resistance 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects listed in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within +/-7.5% Step 1 2 3 4 Change Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 ( C) Temp. Temp. D.F. 0.2max Time 15+/-3 1 15+/-3 1 (min) Initial measurement Insulation Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1h and then sit Resistance for 24+/-2h at room temperature. 25 Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65) and humidity (80%RH to 98%RH) treatment shown below, 10 consecutive times. Appearance No marking defects Humidity Humidity Temperature 8098% 8098% Humidity Humidity Humidity Capacitance Within +/-10% () 9098% 9098% 9098% 70 Change 65 60 55 D.F. 0.2max 50 45 40 35 30 25 Insulation Within the specified initial value. +10 20 - 2 Resistance 15 10 25 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours Initial measurement Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. Perform the initial measurement. Measurement after test Perform a heat treatment at 150+0/10C for 1h and then let sit for 24+/-2h at room temperature, then measure. 6 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No marking defects The charge/discharge current is less than 50mA. Capacitance Within +/-10% Initial measurement Change Perform a heat treatment at 150+0/-10 for 1h and then sit for 24+/-2h at room temperature. D.F. 0.2 max Perform the initial measurement. Measurement after test Perform a heat treatment at 150+0/10C for 1h and then let sit for 24+/-2h at room temperature, then measure. Insulation More than 200M or 5F Resistance (Whichever is smaller) 25 JEMCGS-0735J 2